Please use this identifier to cite or link to this item: http://hdl.handle.net/10995/80716
Title: Study of formation of high aspect GaAs structures based on the method of focused ion beams
Authors: Rezvan, A. A.
Klimin, V. S.
Solodovnik, M. S.
Issue Date: 2018
Publisher: Ural Federal University
Citation: Rezvan A. A. Study of formation of high aspect GaAs structures based on the method of focused ion beams / A. A. Rezvan, V. S. Klimin, M. S. Solodovnik // Scanning Probe Microscopy. Abstract Book of International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2018. — p. 190-191.
URI: http://hdl.handle.net/10995/80716
Conference name: International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials"
Conference date: 26.08.2018-29.08.2018
ISBN: 978-5-9500624-1-4
metadata.dc.description.sponsorship: This work was supported by the Russian Science Foundation Grant No. 15-19-10006. The results were obtained using the equipment of the Research and Education Center and Center for Collective Use "Nanotechnologies" of Southern Federal University.
RSCF project card: 15-19-10006
Origin: International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials". — Ekaterinburg, 2018
Appears in Collections:Scanning Probe Microscopy

Files in This Item:
File Description SizeFormat 
978-5-9500624-1-4_2018_137.pdf195,77 kBAdobe PDFView/Open


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.