ISSN: 2310-757X
Please use this identifier to cite or link to this item:
http://elar.urfu.ru/handle/10995/72206| Title: | Investigation of the Structural, Optical and Electrical Properties of Cu3BiS3 Semiconducting Thin Films |
| Authors: | Yakushev, M. V. Maiello, P. Raadik, T. Shaw, M. J. Edwards, P. R. Krustok, J. Mudryi, A. V. Forbes, I. Martin, R. W. Якушев, М. В. |
| Issue Date: | 2014 |
| Citation: | Investigation of the Structural, Optical and Electrical Properties of Cu3BiS3 Semiconducting Thin Films / M. V. Yakushev, P. Maiello, T. Raadik [et al.] // Energy Procedia. — 2014. — Vol. 60. — P. 166-172. — DOI: 10.1016/j.egypro.2014.12.359. |
| URI: | http://elar.urfu.ru/handle/10995/72206 |
| SCOPUS ID: | 84922355894 |
| WOS ID: | 000358685500025 |
| PURE ID: | 409080 |
| DOI: | 10.1016/j.egypro.2014.12.359 |
| Appears in Collections: | Научные публикации ученых УрФУ, проиндексированные в SCOPUS и WoS CC |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 10.1016-j.egypro.2014.12.359.pdf | 613,61 kB | Adobe PDF | View/Open |
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