Please use this identifier to cite or link to this item:
http://elar.urfu.ru/handle/10995/104066
Title: | STM investigation of 2D alloys and compounds on Si(111) and Ge(111) surfaces |
Authors: | Saranin, A. A. Gruznev, D. V. Bondarenko, L. V. Matetskiy, A. V. Tupchaya, A. Y. Mihalyuk, A. N. Eremeev, S. V. Hsing, C. -R. Wei, C. -M. Ichinokura, S. Hobara, R. Takayama, A. Hasegawa, S. Zotov, A. V. |
Issue Date: | 2017 |
Publisher: | Ural Federal University |
Citation: | STM investigation of 2D alloys and compounds on Si(111) and Ge(111) surfaces / A. A. Saranin, D. V. Gruznev, L. V. Bondarenko et al. // Scanning Probe Microscopy. Abstract Book of International Conference (Ekaterinburg, August 27-30, 2017). — Ekaterinburg, Ural Federal University, 2017. — 22-22 p. |
URI: | http://elar.urfu.ru/handle/10995/104066 |
Conference name: | International Conference "Scanning Probe Microscopy" ; International Youth Conference "Application of Scanning Probe Microscopy in Scientific Research" |
Conference date: | 27.08.2017-30.08.2017 |
ISBN: | 978-5-9500624-0-7 |
Sponsorship: | The work was supported by the Russian Science Foundation (Grant 14-12-00479). |
RSCF project card: | 14-12-00479 |
Origin: | International Conference "Scanning Probe Microscopy" ; International Youth Conference "Application of Scanning Probe Microscopy in Scientific Research". — Ekaterinburg, 2017 |
Appears in Collections: | Scanning Probe Microscopy |
Files in This Item:
File | Description | Size | Format | |
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978-5-9500624-0-7_2017_012.pdf | 150,25 kB | Adobe PDF | View/Open |
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