ISSN: 2310-757X
Please use this identifier to cite or link to this item:
http://elar.urfu.ru/handle/10995/80833| Title: | EDX-analysis for thin films thicknesses determination |
| Authors: | Kamenev, A. A. Mankevich, A. S. |
| Issue Date: | 2018 |
| Publisher: | Ural Federal University |
| Citation: | Kamenev A. A. EDX-analysis for thin films thicknesses determination / A. A. Kamenev, A. S. Mankevich // Scanning Probe Microscopy. Abstract Book of International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2018. — p. 132. |
| URI: | http://elar.urfu.ru/handle/10995/80833 |
| Conference name: | International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials" |
| Conference date: | 26.08.2018-29.08.2018 |
| ISBN: | 978-5-9500624-1-4 |
| metadata.dc.description.sponsorship: | The work was partly supported by the Ministry of Science and Education of Russian Federation under contract 14.579.21.0141. |
| Origin: | International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials". — Ekaterinburg, 2018 |
| Appears in Collections: | Scanning Probe Microscopy |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 978-5-9500624-1-4_2018_092.pdf | 157,44 kB | Adobe PDF | View/Open |
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