ISSN: 2310-757X
Please use this identifier to cite or link to this item:
http://elar.urfu.ru/handle/10995/80824| Title: | Analysis of the conduction mechanism through InSb quantum dot by tunnel CVC method |
| Authors: | Gavrikov, M. V. Mikhailov, A. I. Kabanov, V. F. Glukhovskoy, E. G. |
| Issue Date: | 2018 |
| Publisher: | Ural Federal University |
| Citation: | Analysis of the conduction mechanism through InSb quantum dot by tunnel CVC method / M. V. Gavrikov, A. I. Mikhailov, V. F. Kabanov, E. G. Glukhovskoy // Scanning Probe Microscopy. Abstract Book of International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2018. — p. 120-121. |
| URI: | http://elar.urfu.ru/handle/10995/80824 |
| Conference name: | International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials" |
| Conference date: | 26.08.2018-29.08.2018 |
| ISBN: | 978-5-9500624-1-4 |
| Sponsorship: | This work was supported by grants from the Russian Foundation for Basic Research Projects No. 16-07-00093 and No. 16-07-00185. |
| Origin: | International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials". — Ekaterinburg, 2018 |
| Appears in Collections: | Scanning Probe Microscopy |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 978-5-9500624-1-4_2018_084.pdf | 294,3 kB | Adobe PDF | View/Open |
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