1. Электронный научный архив УрФУ
  2. 00. Общеуниверситетские коллекции
  3. Конференции, семинары, сборники
  4. Scanning Probe Microscopy
Please use this identifier to cite or link to this item: http://elar.urfu.ru/handle/10995/80824
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dc.contributor.authorGavrikov, M. V.en
dc.contributor.authorMikhailov, A. I.en
dc.contributor.authorKabanov, V. F.en
dc.contributor.authorGlukhovskoy, E. G.en
dc.date.accessioned2020-03-24T06:59:49Z-
dc.date.available2020-03-24T06:59:49Z-
dc.date.issued2018-
dc.identifier.citationAnalysis of the conduction mechanism through InSb quantum dot by tunnel CVC method / M. V. Gavrikov, A. I. Mikhailov, V. F. Kabanov, E. G. Glukhovskoy // Scanning Probe Microscopy. Abstract Book of International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2018. — p. 120-121.en
dc.identifier.isbn978-5-9500624-1-4-
dc.identifier.urihttp://elar.urfu.ru/handle/10995/80824-
dc.description.sponsorshipThis work was supported by grants from the Russian Foundation for Basic Research Projects No. 16-07-00093 and No. 16-07-00185.en
dc.format.mimetypeapplication/pdfen
dc.language.isoenen
dc.publisherUral Federal Universityen
dc.relation.ispartofInternational Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials". — Ekaterinburg, 2018en
dc.titleAnalysis of the conduction mechanism through InSb quantum dot by tunnel CVC methoden
dc.typeConference Paperen
dc.typeinfo:eu-repo/semantics/conferenceObjecten
dc.typeinfo:eu-repo/semantics/publishedVersionen
dc.conference.nameInternational Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials"en
dc.conference.date26.08.2018-29.08.2018-
local.description.firstpage120-
local.description.lastpage121-
local.description.orderP-25-
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