ISSN: 2310-757X
Please use this identifier to cite or link to this item:
http://elar.urfu.ru/handle/10995/80770| Title: | Atomic and electronic structure of nanostructured few-layer graphene with self-aligned boundaries synthesized on SiC/Si(001) wafers |
| Authors: | Chaika, A. N. Wu, H. -C. Molodtsova, O. V. Hsu, M. -C. Huang, T. -W. Chang, C. -R. Walls, B. Shvets, I. V. Aristov, V. Yu. |
| Issue Date: | 2018 |
| Publisher: | Ural Federal University |
| Citation: | Atomic and electronic structure of nanostructured few-layer graphene with self-aligned boundaries synthesized on SiC/Si(001) wafers / A. N. Chaika, H. -C. Wu, O. V. Molodtsova, M. -C. Hsu, T. -W. Huang, C. -R. Chang, B. Walls, I. V. Shvets, V. Yu. Aristov // Scanning Probe Microscopy. Abstract Book of International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2018. — p. 50. |
| URI: | http://elar.urfu.ru/handle/10995/80770 |
| Conference name: | International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials" |
| Conference date: | 26.08.2018-29.08.2018 |
| ISBN: | 978-5-9500624-1-4 |
| Sponsorship: | This work was partially supported by the Russian Academy of Sciences, Russian Foundation for Basic Research (grant № 17-02-01139, 17-02-01291), Beijing Institute of Technology Research Fund Program for Young Scholars, and Science Foundation Ireland. |
| Origin: | International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials". — Ekaterinburg, 2018 |
| Appears in Collections: | Scanning Probe Microscopy |
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| 978-5-9500624-1-4_2018_035.pdf | 287,61 kB | Adobe PDF | View/Open |
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