ISSN: 2310-757X
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http://elar.urfu.ru/handle/10995/80770Полная запись метаданных
| Поле DC | Значение | Язык |
|---|---|---|
| dc.contributor.author | Chaika, A. N. | en |
| dc.contributor.author | Wu, H. -C. | en |
| dc.contributor.author | Molodtsova, O. V. | en |
| dc.contributor.author | Hsu, M. -C. | en |
| dc.contributor.author | Huang, T. -W. | en |
| dc.contributor.author | Chang, C. -R. | en |
| dc.contributor.author | Walls, B. | en |
| dc.contributor.author | Shvets, I. V. | en |
| dc.contributor.author | Aristov, V. Yu. | en |
| dc.date.accessioned | 2020-03-24T06:59:37Z | - |
| dc.date.available | 2020-03-24T06:59:37Z | - |
| dc.date.issued | 2018 | - |
| dc.identifier.citation | Atomic and electronic structure of nanostructured few-layer graphene with self-aligned boundaries synthesized on SiC/Si(001) wafers / A. N. Chaika, H. -C. Wu, O. V. Molodtsova, M. -C. Hsu, T. -W. Huang, C. -R. Chang, B. Walls, I. V. Shvets, V. Yu. Aristov // Scanning Probe Microscopy. Abstract Book of International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2018. — p. 50. | en |
| dc.identifier.isbn | 978-5-9500624-1-4 | - |
| dc.identifier.uri | http://elar.urfu.ru/handle/10995/80770 | - |
| dc.description.sponsorship | This work was partially supported by the Russian Academy of Sciences, Russian Foundation for Basic Research (grant № 17-02-01139, 17-02-01291), Beijing Institute of Technology Research Fund Program for Young Scholars, and Science Foundation Ireland. | en |
| dc.format.mimetype | application/pdf | en |
| dc.language.iso | en | en |
| dc.publisher | Ural Federal University | en |
| dc.relation.ispartof | International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials". — Ekaterinburg, 2018 | en |
| dc.title | Atomic and electronic structure of nanostructured few-layer graphene with self-aligned boundaries synthesized on SiC/Si(001) wafers | en |
| dc.type | Conference Paper | en |
| dc.type | info:eu-repo/semantics/conferenceObject | en |
| dc.type | info:eu-repo/semantics/publishedVersion | en |
| dc.conference.name | International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials" | en |
| dc.conference.date | 26.08.2018-29.08.2018 | - |
| local.description.firstpage | 50 | - |
| local.description.lastpage | 50 | - |
| local.description.order | O-12 | - |
| Располагается в коллекциях: | Scanning Probe Microscopy | |
Файлы этого ресурса:
| Файл | Описание | Размер | Формат | |
|---|---|---|---|---|
| 978-5-9500624-1-4_2018_035.pdf | 287,61 kB | Adobe PDF | Просмотреть/Открыть |
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