1. Электронный научный архив УрФУ
2. 00. Общеуниверситетские коллекции
3. Конференции, семинары, сборники
4. Scanning Probe Microscopy

Название:	Atomic and electronic structure of nanostructured few-layer graphene with self-aligned boundaries synthesized on SiC/Si(001) wafers
Авторы:	Chaika, A. N. Wu, H. -C. Molodtsova, O. V. Hsu, M. -C. Huang, T. -W. Chang, C. -R. Walls, B. Shvets, I. V. Aristov, V. Yu.
Дата публикации:	2018
Издатель:	Ural Federal University
Библиографическое описание:	Atomic and electronic structure of nanostructured few-layer graphene with self-aligned boundaries synthesized on SiC/Si(001) wafers / A. N. Chaika, H. -C. Wu, O. V. Molodtsova, M. -C. Hsu, T. -W. Huang, C. -R. Chang, B. Walls, I. V. Shvets, V. Yu. Aristov // Scanning Probe Microscopy. Abstract Book of International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2018. — p. 50.
URI:	http://elar.urfu.ru/handle/10995/80770
Конференция/семинар:	International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials"
Дата конференции/семинара:	26.08.2018-29.08.2018
ISBN:	978-5-9500624-1-4
Сведения о поддержке:	This work was partially supported by the Russian Academy of Sciences, Russian Foundation for Basic Research (grant № 17-02-01139, 17-02-01291), Beijing Institute of Technology Research Fund Program for Young Scholars, and Science Foundation Ireland.
Источники:	International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials". — Ekaterinburg, 2018
Располагается в коллекциях:	Scanning Probe Microscopy

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