Please use this identifier to cite or link to this item: http://hdl.handle.net/10995/80770
Title: Atomic and electronic structure of nanostructured few-layer graphene with self-aligned boundaries synthesized on SiC/Si(001) wafers
Authors: Chaika, A. N.
Wu, H. -C.
Molodtsova, O. V.
Hsu, M. -C.
Huang, T. -W.
Chang, C. -R.
Walls, B.
Shvets, I. V.
Aristov, V. Yu.
Issue Date: 2018
Publisher: Ural Federal University
Citation: Atomic and electronic structure of nanostructured few-layer graphene with self-aligned boundaries synthesized on SiC/Si(001) wafers / A. N. Chaika, H. -C. Wu, O. V. Molodtsova, M. -C. Hsu, T. -W. Huang, C. -R. Chang, B. Walls, I. V. Shvets, V. Yu. Aristov // Scanning Probe Microscopy. Abstract Book of International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2018. — p. 50.
URI: http://hdl.handle.net/10995/80770
Conference name: International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials"
Conference date: 26.08.2018-29.08.2018
ISBN: 978-5-9500624-1-4
metadata.dc.description.sponsorship: This work was partially supported by the Russian Academy of Sciences, Russian Foundation for Basic Research (grant № 17-02-01139, 17-02-01291), Beijing Institute of Technology Research Fund Program for Young Scholars, and Science Foundation Ireland.
Origin: International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials". — Ekaterinburg, 2018
Appears in Collections:Scanning Probe Microscopy

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