ISSN: 2310-757X
Please use this identifier to cite or link to this item:
http://elar.urfu.ru/handle/10995/80745| Title: | Investigation of the properties of quantum-dimensional semiconductor particles A3B5 by scanning probe microscopy, obtained by liquid chemical etching |
| Authors: | Yashina, N. Yu. Gavrikov, M. V. Al-Alwani, A. J. Tsvetkova, O. Yu. Sevostyanov, V. P. Kabanov, V. F. Glukhovskoy, E. G. |
| Issue Date: | 2018 |
| Publisher: | Ural Federal University |
| Citation: | Investigation of the properties of quantum-dimensional semiconductor particles A3B5 by scanning probe microscopy, obtained by liquid chemical etching / N. Yu. Yashina, M. V. Gavrikov, A. J. Al-Alwani, O. Yu. Tsvetkova, V. P. Sevostyanov, V. F. Kabanov, E. G. Glukhovskoy // Scanning Probe Microscopy. Abstract Book of International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2018. — p. 227-228. |
| URI: | http://elar.urfu.ru/handle/10995/80745 |
| Conference name: | International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials" |
| Conference date: | 26.08.2018-29.08.2018 |
| ISBN: | 978-5-9500624-1-4 |
| Sponsorship: | The study was carried out with the financial support of the Russian Foundation for Basic Research in the framework of scientific projects 17-07-00407-а and 17-07-00139. |
| Origin: | International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials". — Ekaterinburg, 2018 |
| Appears in Collections: | Scanning Probe Microscopy |
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| File | Description | Size | Format | |
|---|---|---|---|---|
| 978-5-9500624-1-4_2018_163.pdf | 163,77 kB | Adobe PDF | View/Open |
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