Please use this identifier to cite or link to this item: http://hdl.handle.net/10995/80745
Title: Investigation of the properties of quantum-dimensional semiconductor particles A3B5 by scanning probe microscopy, obtained by liquid chemical etching
Authors: Yashina, N. Yu.
Gavrikov, M. V.
Al-Alwani, A. J.
Tsvetkova, O. Yu.
Sevostyanov, V. P.
Kabanov, V. F.
Glukhovskoy, E. G.
Issue Date: 2018
Publisher: Ural Federal University
Citation: Investigation of the properties of quantum-dimensional semiconductor particles A3B5 by scanning probe microscopy, obtained by liquid chemical etching / N. Yu. Yashina, M. V. Gavrikov, A. J. Al-Alwani, O. Yu. Tsvetkova, V. P. Sevostyanov, V. F. Kabanov, E. G. Glukhovskoy // Scanning Probe Microscopy. Abstract Book of International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2018. — p. 227-228.
URI: http://hdl.handle.net/10995/80745
Conference name: International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials"
Conference date: 26.08.2018-29.08.2018
ISBN: 978-5-9500624-1-4
metadata.dc.description.sponsorship: The study was carried out with the financial support of the Russian Foundation for Basic Research in the framework of scientific projects 17-07-00407-а and 17-07-00139.
Origin: International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials". — Ekaterinburg, 2018
Appears in Collections:Scanning Probe Microscopy

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