ISSN: 2310-757X
Please use this identifier to cite or link to this item:
http://elar.urfu.ru/handle/10995/80740| Title: | Effect of thickness on the piezoelectric properties of LiNbO3 films |
| Authors: | Vakulov, Z. E. Varzarev, Y. N. Skrylev , A. V. Panich, A. E. Golosov, D. A. Zavadskiy, S. M. Dostanko, A. P. Ageev, O. A. |
| Issue Date: | 2018 |
| Publisher: | Ural Federal University |
| Citation: | Effect of thickness on the piezoelectric properties of LiNbO3 films / Z. E. Vakulov, Y. N. Varzarev, A. V. Skrylev , A. E. Panich, D. A. Golosov, S. M. Zavadskiy, A. P. Dostanko, O. A. Ageev // Scanning Probe Microscopy. Abstract Book of International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2018. — p. 222-223. |
| URI: | http://elar.urfu.ru/handle/10995/80740 |
| Conference name: | International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials" |
| Conference date: | 26.08.2018-29.08.2018 |
| ISBN: | 978-5-9500624-1-4 |
| metadata.dc.description.sponsorship: | The results were obtained using the equipment of Research and Education Center and the Center of collective use “Nanotechnology” of Southern Federal University. |
| Origin: | International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials". — Ekaterinburg, 2018 |
| Appears in Collections: | Scanning Probe Microscopy |
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| File | Description | Size | Format | |
|---|---|---|---|---|
| 978-5-9500624-1-4_2018_159.pdf | 257,85 kB | Adobe PDF | View/Open |
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