Formation of memristor structures based on ZnO thin films by scratching probe nanolithography

Please use this identifier to cite or link to this item: http://elar.urfu.ru/handle/10995/80736

Title:	Formation of memristor structures based on ZnO thin films by scratching probe nanolithography
Authors:	Tominov, R. V. Avilov, V. I. Klimin, V. S. Smirnov, V. A. Chernenko, N. E.
Issue Date:	2018
Publisher:	Ural Federal University
Citation:	Formation of memristor structures based on ZnO thin films by scratching probe nanolithography / R. V. Tominov, V. I. Avilov, V. S. Klimin, V. A. Smirnov, N. E. Chernenko // Scanning Probe Microscopy. Abstract Book of International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2018. — p. 217-218.
URI:	http://elar.urfu.ru/handle/10995/80736
Conference name:	International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials"
Conference date:	26.08.2018-29.08.2018
ISBN:	978-5-9500624-1-4
Sponsorship:	This work was supported by Grant of the President of the Russian Federation No. MK-2721.2018.8. and by RFBR according to the research project № 18-37-00299
Origin:	International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials". — Ekaterinburg, 2018
Appears in Collections:	Scanning Probe Microscopy

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