ISSN: 2310-757X
Please use this identifier to cite or link to this item:
http://elar.urfu.ru/handle/10995/79125| Title: | Novel technology for fabrication of probe tips for SPM using focused ion beam induced deposition method |
| Authors: | Shandyba, N. A. Panchenko, I. V. Kolomiytsev, A. S. Lisitsyn, S. A. |
| Issue Date: | 2019 |
| Publisher: | Ural Federal University |
| Citation: | Shandyba N. A. Novel technology for fabrication of probe tips for SPM using focused ion beam induced deposition method / N. A. Shandyba, I. V. Panchenko, A. S. Kolomiytsev, S. A. Lisitsyn // Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. Abstract Book of Joint International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2019. — P. 254-255. |
| URI: | http://elar.urfu.ru/handle/10995/79125 |
| Conference name: | 3rd International Conference "Scanning Probe Microscopy" ; 4th Russia-China Workshop on Dielectric and Ferroelectric Materials ; International Youth Conference "Functional Imaging of nanomaterials" |
| Conference date: | 25.08.2019-28.08.2019 |
| ISBN: | 978-5-9500624-2-1 |
| Sponsorship: | The work was done through a grant from the Russian Science Foundation (project No. 18-79-00175) using the equipment of the Research and Education Center and the Nanotechnology Joint Use Center of the Southern Federal University (Taganrog). |
| RSCF project card: | 18-79-00175 |
| Origin: | Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. — Ekaterinburg, 2019 |
| Appears in Collections: | Scanning Probe Microscopy |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 978-5-9500624-2-1_2019_206.pdf | 236,99 kB | Adobe PDF | View/Open |
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