ISSN: 2310-757X
Please use this identifier to cite or link to this item:
http://elar.urfu.ru/handle/10995/79054| Title: | Conductive Atomic Force Microscopy study of local resistive switching by a complex signal in the yttria stabilized zirconia films |
| Authors: | Filatov, D. O. Koryazhkina, M. N. Antonov, D. A. Antonov, I. N. Liskin, D. A. Ryabova, M. A. Gorshkov, O. N. |
| Issue Date: | 2019 |
| Publisher: | Ural Federal University |
| Citation: | Conductive Atomic Force Microscopy study of local resistive switching by a complex signal in the yttria stabilized zirconia films / D. O. Filatov, M. N. Koryazhkina, D. A. Antonov, I. N. Antonov, D. A. Liskin, M. A. Ryabova, O. N. Gorshkov // Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. Abstract Book of Joint International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2019. — P. 177-178. |
| URI: | http://elar.urfu.ru/handle/10995/79054 |
| Conference name: | 3rd International Conference "Scanning Probe Microscopy" ; 4th Russia-China Workshop on Dielectric and Ferroelectric Materials ; International Youth Conference "Functional Imaging of nanomaterials" |
| Conference date: | 25.08.2019-28.08.2019 |
| ISBN: | 978-5-9500624-2-1 |
| Sponsorship: | This work was supported by RFBR (18-42-520059р_а). |
| Origin: | Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. — Ekaterinburg, 2019 |
| Appears in Collections: | Scanning Probe Microscopy |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 978-5-9500624-2-1_2019_142.pdf | 723,01 kB | Adobe PDF | View/Open |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.