Please use this identifier to cite or link to this item: http://elar.urfu.ru/handle/10995/27505
Title: The reliability of soldered joints produced at a low temperature
Authors: Shtennikov, V. N.
Budai, B. T.
Issue Date: 2013
Citation: Shtennikov V. N. The reliability of soldered joints produced at a low temperature / V. N. Shtennikov, B. T. Budai // Russian Journal of Nondestructive Testing. — 2013. — Vol. 49. — № 9. — P. 548-551.
Abstract: Under severe service conditions of electronic instruments (at elevated temperatures and vibrations in electronic systems), failures in their operation frequently occur. Severe intrinsic thermal conditions of operating instruments may cause such failures. However, malfunctions in electronic devices may often be due to defects in soldered joints that were made at lowered temperatures. An approach is proposed that makes it possible to considerably improve the reliability of soldered joints. © 2013 Pleiades Publishing, Ltd.
Keywords: DEFECT
QUALITY
SOLDERING IRON
TEMPERATURE
TESTING
THERMAL CONDUCTIVITY COEFFICIENT
ELECTRONIC DEVICE
ELECTRONIC INSTRUMENTS
ELECTRONIC SYSTEMS
ELEVATED TEMPERATURE
LOW TEMPERATURES
SERVICE CONDITIONS
THERMAL CONDITION
THERMAL CONDUCTIVITY COEFFICIENT
DEFECTS
ELECTRONICS INDUSTRY
IMAGE QUALITY
SOLDERED JOINTS
TEMPERATURE
TESTING
THERMAL CONDUCTIVITY
URI: http://elar.urfu.ru/handle/10995/27505
SCOPUS ID: 84891071506
WOS ID: 000328282200010
PURE ID: 877807
ISSN: 1061-8309
DOI: 10.1134/S1061830913090088
Appears in Collections:Научные публикации ученых УрФУ, проиндексированные в SCOPUS и WoS CC

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