Please use this identifier to cite or link to this item: http://elar.urfu.ru/handle/10995/132173
Title: Domain kinetics during polarization reversal in 36? Y-cut congruent lithium niobate
Authors: Neradovskaia, E. A.
Neradovskiy, M. M.
Esin, A. A.
Chuvakova, M. A.
Baldil, P.
De, Micheli, M. P.
Akhmatkhanov, A. R.
Forget, N.
Shur, V. Y.
Шур, В. Я.
Issue Date: 2018
Publisher: Institute of Physics Publishing
Citation: Neradovskiy, M. M., Esin, A. A., Chuvakova, M. A., Baldil, P., De Micheli, M. P., Akhmatkhanov, A. R., Forget, N., Shur, V. Y., & Neradovskaia, E. A. (2018). Domain kinetics during polarization reversal in 36? Y-cut congruent lithium niobate. IOP Conference Series: Materials Science and Engineering, 443(1), [012024]. https://doi.org/10.1088/1757-899X/443/1/012024
Abstract: We present experimental study of domain kinetics in 36? Y-cut congruent lithium niobate during polarization reversal by increasing external electric field using liquid electrodes. The motion of the domain walls has been imaged on the Zs+ and Zs-polar surfaces of the crystal simultaneously. The linear dependence of the threshold field on the field rate has been revealed. The threshold field in low field rate limit has been estimated as 32.8 ? 0.3 kV/mm, which is lower than predicted value. The switching process for polarization reversal in the constant field has dramatically accelerated with increase of external electrical field above threshold. The new approach, which accelerates significantly the in situ study of 3D domain kinetics in CLN crystals, has been demonstrated. © 2018 Institute of Physics Publishing. All rights reserved.
Keywords: DOMAIN WALLS
ELECTRIC FIELDS
HYDROPHOBICITY
KINETICS
LITHIUM
NIOBIUM COMPOUNDS
SCANNING PROBE MICROSCOPY
CONGRUENT LITHIUM NIOBATE
ELECTRICAL FIELD
EXTERNAL ELECTRIC FIELD
LINEAR DEPENDENCE
LIQUID ELECTRODES
POLARIZATION REVERSALS
SWITCHING PROCESS
THRESHOLD FIELDS
POLARIZATION
URI: http://elar.urfu.ru/handle/10995/132173
Access: info:eu-repo/semantics/openAccess
Conference name: International Conference on Scanning Probe Microscopy, SPM 2018
Conference date: 26 August 2018 through 29 August 2018
RSCI ID: 38624204
SCOPUS ID: 85057436463
PURE ID: 8322027
ISSN: 1757-8981
DOI: 10.1088/1757-899X/443/1/012024
Sponsorship: et al.;NT-MDT Spectrum Instruments;Ostec-ArtTool Ltd.;Promenergolab LLC;Russian Foundation for Basic Research;Taylor and Francis Group
Appears in Collections:Научные публикации ученых УрФУ, проиндексированные в SCOPUS и WoS CC

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