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http://elar.urfu.ru/handle/10995/132173
Title: | Domain kinetics during polarization reversal in 36? Y-cut congruent lithium niobate |
Authors: | Neradovskaia, E. A. Neradovskiy, M. M. Esin, A. A. Chuvakova, M. A. Baldil, P. De, Micheli, M. P. Akhmatkhanov, A. R. Forget, N. Shur, V. Y. Шур, В. Я. |
Issue Date: | 2018 |
Publisher: | Institute of Physics Publishing |
Citation: | Neradovskiy, M. M., Esin, A. A., Chuvakova, M. A., Baldil, P., De Micheli, M. P., Akhmatkhanov, A. R., Forget, N., Shur, V. Y., & Neradovskaia, E. A. (2018). Domain kinetics during polarization reversal in 36? Y-cut congruent lithium niobate. IOP Conference Series: Materials Science and Engineering, 443(1), [012024]. https://doi.org/10.1088/1757-899X/443/1/012024 |
Abstract: | We present experimental study of domain kinetics in 36? Y-cut congruent lithium niobate during polarization reversal by increasing external electric field using liquid electrodes. The motion of the domain walls has been imaged on the Zs+ and Zs-polar surfaces of the crystal simultaneously. The linear dependence of the threshold field on the field rate has been revealed. The threshold field in low field rate limit has been estimated as 32.8 ? 0.3 kV/mm, which is lower than predicted value. The switching process for polarization reversal in the constant field has dramatically accelerated with increase of external electrical field above threshold. The new approach, which accelerates significantly the in situ study of 3D domain kinetics in CLN crystals, has been demonstrated. © 2018 Institute of Physics Publishing. All rights reserved. |
Keywords: | DOMAIN WALLS ELECTRIC FIELDS HYDROPHOBICITY KINETICS LITHIUM NIOBIUM COMPOUNDS SCANNING PROBE MICROSCOPY CONGRUENT LITHIUM NIOBATE ELECTRICAL FIELD EXTERNAL ELECTRIC FIELD LINEAR DEPENDENCE LIQUID ELECTRODES POLARIZATION REVERSALS SWITCHING PROCESS THRESHOLD FIELDS POLARIZATION |
URI: | http://elar.urfu.ru/handle/10995/132173 |
Access: | info:eu-repo/semantics/openAccess |
Conference name: | International Conference on Scanning Probe Microscopy, SPM 2018 |
Conference date: | 26 August 2018 through 29 August 2018 |
RSCI ID: | 38624204 |
SCOPUS ID: | 85057436463 |
PURE ID: | 8322027 |
ISSN: | 1757-8981 |
DOI: | 10.1088/1757-899X/443/1/012024 |
Sponsorship: | et al.;NT-MDT Spectrum Instruments;Ostec-ArtTool Ltd.;Promenergolab LLC;Russian Foundation for Basic Research;Taylor and Francis Group |
Appears in Collections: | Научные публикации ученых УрФУ, проиндексированные в SCOPUS и WoS CC |
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