Пожалуйста, используйте этот идентификатор, чтобы цитировать или ссылаться на этот ресурс:
http://elar.urfu.ru/handle/10995/130365
Полная запись метаданных
Поле DC | Значение | Язык |
---|---|---|
dc.contributor.author | Kovalev, M. | en |
dc.contributor.author | Podlesnykh, I. | en |
dc.contributor.author | Nastulyavichus, A. | en |
dc.contributor.author | Stsepuro, N. | en |
dc.contributor.author | Mushkarina, I. | en |
dc.contributor.author | Platonov, P. | en |
dc.contributor.author | Terukov, E. | en |
dc.contributor.author | Abolmasov, S. | en |
dc.contributor.author | Dunaev, A. | en |
dc.contributor.author | Akhmatkhanov, A. | en |
dc.contributor.author | Shur, V. | en |
dc.contributor.author | Kudryashov, S. | en |
dc.date.accessioned | 2024-04-05T16:18:59Z | - |
dc.date.available | 2024-04-05T16:18:59Z | - |
dc.date.issued | 2023 | - |
dc.identifier.citation | Kovalev, M, Podlesnykh, I, Nastulyavichus, A, Stsepuro, N, Mushkarina, I, Platonov, P, Terukov, E, Abolmasov, S, Dunaev, A, Akhmatkhanov, A, Shur, V & Kudryashov, S 2023, 'Efficient Broadband Light-Trapping Structures on Thin-Film Silicon Fabricated by Laser, Chemical and Hybrid Chemical/Laser Treatments', Materials, Том. 16, № 6, 2350. https://doi.org/10.3390/ma16062350 | harvard_pure |
dc.identifier.citation | Kovalev, M., Podlesnykh, I., Nastulyavichus, A., Stsepuro, N., Mushkarina, I., Platonov, P., Terukov, E., Abolmasov, S., Dunaev, A., Akhmatkhanov, A., Shur, V., & Kudryashov, S. (2023). Efficient Broadband Light-Trapping Structures on Thin-Film Silicon Fabricated by Laser, Chemical and Hybrid Chemical/Laser Treatments. Materials, 16(6), [2350]. https://doi.org/10.3390/ma16062350 | apa_pure |
dc.identifier.issn | 1996-1944 | - |
dc.identifier.other | Final | 2 |
dc.identifier.other | All Open Access, Gold, Green | 3 |
dc.identifier.other | https://www.scopus.com/inward/record.uri?eid=2-s2.0-85151509978&doi=10.3390%2fma16062350&partnerID=40&md5=1e5bec93753518b1c1f594ea8e8add96 | 1 |
dc.identifier.other | https://www.mdpi.com/1996-1944/16/6/2350/pdf?version=1678866072 | |
dc.identifier.uri | http://elar.urfu.ru/handle/10995/130365 | - |
dc.description.abstract | Light-trapping structures formed on surfaces of various materials have attracted much attention in recent years due to their important role in many applications of science and technology. This article discusses various methods for manufacturing light-trapping “black” silicon, namely laser, chemical and hybrid chemical/laser ones. In addition to the widely explored laser texturing and chemical etching methods, we develop a hybrid chemical/laser texturing method, consisting in laser post-texturing of pyramidal structures obtained after chemical etching. After laser treatments the surface morphology was represented by a chaotic relief of microcones, while after chemical treatment it acquired a chaotic pyramidal relief. Moreover, laser texturing of preliminarily chemically microtextured silicon wafers is shown to take five-fold less time compared to bare flat silicon. In this case, the chemically/laser-treated samples exhibit average total reflectance in the spectral range of 250–1100 nm lower by 7–10% than after the purely chemical treatment. © 2023 by the authors. | en |
dc.description.sponsorship | Ministry of Education and Science of the Russian Federation, Minobrnauka; Ministry of Science and Higher Education of the Russian Federation: 075-15-2021-677 | en |
dc.description.sponsorship | We thank the Ural Center for Shared Use “Modern nanotechnology” of Ural Federal University (Reg.#2968), which is supported by the Ministry of Science and Higher Education RF (Project #075-15-2021-677) for the provided research equipment; and Evgeny Kuzmin from Lebedev Physical Institute for the preparation . | en |
dc.description.sponsorship | This research was funded by the Ministry of Science and Higher Education of the Russian Federation (Ural Federal University Program of Development within the Priority-2030 Program). | en |
dc.format.mimetype | application/pdf | en |
dc.language.iso | en | en |
dc.publisher | MDPI | en |
dc.rights | info:eu-repo/semantics/openAccess | en |
dc.rights | cc-by | other |
dc.rights.uri | https://creativecommons.org/licenses/by/4.0/ | unpaywall |
dc.source | Materials | 2 |
dc.source | Materials | en |
dc.subject | CHEMICAL ETCHING | en |
dc.subject | LASER TEXTURING | en |
dc.subject | LIGHT-TRAPPING | en |
dc.subject | REFLECTION COEFFICIENT | en |
dc.subject | SURFACE MICROSTRUCTURES | en |
dc.subject | ETCHING | en |
dc.subject | MORPHOLOGY | en |
dc.subject | SILICON WAFERS | en |
dc.subject | SURFACE MORPHOLOGY | en |
dc.subject | BROADBAND LIGHT | en |
dc.subject | CHAOTICS | en |
dc.subject | CHEMICAL ETCHING | en |
dc.subject | CHEMICAL TREATMENTS | en |
dc.subject | LASER TEXTURING | en |
dc.subject | LASER TREATMENT | en |
dc.subject | LIGHT TRAPPING STRUCTURES | en |
dc.subject | LIGHT-TRAPPING | en |
dc.subject | SURFACE MICROSTRUCTURES | en |
dc.subject | THIN FILM SILICON | en |
dc.subject | REFLECTION | en |
dc.title | Efficient Broadband Light-Trapping Structures on Thin-Film Silicon Fabricated by Laser, Chemical and Hybrid Chemical/Laser Treatments | en |
dc.type | Article | en |
dc.type | info:eu-repo/semantics/article | en |
dc.type | |info:eu-repo/semantics/publishedVersion | en |
dc.identifier.doi | 10.3390/ma16062350 | - |
dc.identifier.scopus | 85151509978 | - |
local.contributor.employee | Kovalev, M., Lebedev Physical Institute, Moscow, 119991, Russian Federation, School of Natural Sciences and Mathematics, Ural Federal University, Ekaterinburg, 620000, Russian Federation | en |
local.contributor.employee | Podlesnykh, I., Lebedev Physical Institute, Moscow, 119991, Russian Federation, Laser and Optoelectronic Systems Department, Bauman Moscow State Technical University, 2nd Baumanskaya St. 5/1, Moscow, 105005, Russian Federation | en |
local.contributor.employee | Nastulyavichus, A., Lebedev Physical Institute, Moscow, 119991, Russian Federation | en |
local.contributor.employee | Stsepuro, N., Lebedev Physical Institute, Moscow, 119991, Russian Federation | en |
local.contributor.employee | Mushkarina, I., Lebedev Physical Institute, Moscow, 119991, Russian Federation | en |
local.contributor.employee | Platonov, P., Laser and Optoelectronic Systems Department, Bauman Moscow State Technical University, 2nd Baumanskaya St. 5/1, Moscow, 105005, Russian Federation | en |
local.contributor.employee | Terukov, E., Department of Electronics, St. Petersburg State Electrotechnical University, ul. Professora Popova 5, St. Petersburg, 197022, Russian Federation | en |
local.contributor.employee | Abolmasov, S., R&D Center of Thin Film Technologies in Energetics, St. Petersburg, 194064, Russian Federation | en |
local.contributor.employee | Dunaev, A., All-Russian Research Institute for Optical and Physical Measurements, Moscow, 119361, Russian Federation | en |
local.contributor.employee | Akhmatkhanov, A., School of Natural Sciences and Mathematics, Ural Federal University, Ekaterinburg, 620000, Russian Federation | en |
local.contributor.employee | Shur, V., School of Natural Sciences and Mathematics, Ural Federal University, Ekaterinburg, 620000, Russian Federation | en |
local.contributor.employee | Kudryashov, S., Lebedev Physical Institute, Moscow, 119991, Russian Federation, School of Natural Sciences and Mathematics, Ural Federal University, Ekaterinburg, 620000, Russian Federation | en |
local.issue | 6 | - |
local.volume | 16 | - |
dc.identifier.wos | 000959743200001 | - |
local.contributor.department | Lebedev Physical Institute, Moscow, 119991, Russian Federation | en |
local.contributor.department | School of Natural Sciences and Mathematics, Ural Federal University, Ekaterinburg, 620000, Russian Federation | en |
local.contributor.department | Laser and Optoelectronic Systems Department, Bauman Moscow State Technical University, 2nd Baumanskaya St. 5/1, Moscow, 105005, Russian Federation | en |
local.contributor.department | Department of Electronics, St. Petersburg State Electrotechnical University, ul. Professora Popova 5, St. Petersburg, 197022, Russian Federation | en |
local.contributor.department | R&D Center of Thin Film Technologies in Energetics, St. Petersburg, 194064, Russian Federation | en |
local.contributor.department | All-Russian Research Institute for Optical and Physical Measurements, Moscow, 119361, Russian Federation | en |
local.identifier.pure | 37080864 | - |
local.description.order | 2350 | - |
local.identifier.eid | 2-s2.0-85151509978 | - |
local.identifier.wos | WOS:000959743200001 | - |
Располагается в коллекциях: | Научные публикации ученых УрФУ, проиндексированные в SCOPUS и WoS CC |
Файлы этого ресурса:
Файл | Описание | Размер | Формат | |
---|---|---|---|---|
2-s2.0-85151509978.pdf | 16,52 MB | Adobe PDF | Просмотреть/Открыть |
Лицензия на ресурс: Лицензия Creative Commons