Transverse Negative Magnetoresistance of Two-dimensional Structures in the Presence of a Strong In-plane Magnetic Field: Weak Localization as a Probe of Interface Roughness

Minkov, G. M.; Rut, O. E.; Germanenko, A. V.; Sherstobitov, A. A.; Zvonkov, B. N.; Shashkin, V. I.; Khrykin, O. I.; Filatov, D. O.

Please use this identifier to cite or link to this item: http://elar.urfu.ru/handle/10995/111498

Title:	Transverse Negative Magnetoresistance of Two-dimensional Structures in the Presence of a Strong In-plane Magnetic Field: Weak Localization as a Probe of Interface Roughness
Authors:	Minkov, G. M. Rut, O. E. Germanenko, A. V. Sherstobitov, A. A. Zvonkov, B. N. Shashkin, V. I. Khrykin, O. I. Filatov, D. O.
Issue Date:	2004
Publisher:	American Physical Society (APS)
Citation:	Transverse Negative Magnetoresistance of Two-dimensional Structures in the Presence of a Strong In-plane Magnetic Field: Weak Localization as a Probe of Interface Roughness / G. M. Minkov, O. E. Rut, A. V. Germanenko et al. // Physical Review B - Condensed Matter and Materials Physics. — 2004. — Vol. 70. — Iss. 3. — P. 035304-1-035304-8. — 035304.
Abstract:	The interference induced transverse negative magnetoresistance of GaAs/InxGa1-xAs/GaAs quantum well heterostructures has been studied in the presence of strong in-plane magnetic field. It is shown that the effect of in-plane magnetic field is determined by the interface roughness and strongly depends on the relationship between mean free path, phase breaking length, and roughness correlation length. Analysis of the experimental results allows us to estimate parameters of short- and long-range correlated roughness which have been found in a good agreement with atomic force microscopy data obtained for just the same samples.
Keywords:	GALLIUM ARSENIDE ARTICLE ATOMIC FORCE MICROSCOPY CORRELATION ANALYSIS MAGNETIC FIELD MAGNETISM MATHEMATICAL COMPUTING SURFACE PROPERTY
URI:	http://elar.urfu.ru/handle/10995/111498
Access:	info:eu-repo/semantics/openAccess
SCOPUS ID:	42749100849
WOS ID:	000222996700067
PURE ID:	8533024
ISSN:	0163-1829
metadata.dc.description.sponsorship:	This work was supported in part by the RFBR through Grant Nos. 01-02-16441, 03-02-16150, 03-02-06025, and 04-02-16626, the CRDF through Grant Nos. EK-005-X1 and Y1-P-05-11, and the Russian Program Physics of Solid State Nanostructures.
Appears in Collections:	Научные публикации ученых УрФУ, проиндексированные в SCOPUS и WoS CC

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