Transverse Negative Magnetoresistance of Two-dimensional Structures in the Presence of a Strong In-plane Magnetic Field: Weak Localization as a Probe of Interface Roughness

Minkov, G. M.; Rut, O. E.; Germanenko, A. V.; Sherstobitov, A. A.; Zvonkov, B. N.; Shashkin, V. I.; Khrykin, O. I.; Filatov, D. O.

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Поле DC	Значение	Язык
dc.contributor.author	Minkov, G. M.	en
dc.contributor.author	Rut, O. E.	en
dc.contributor.author	Germanenko, A. V.	en
dc.contributor.author	Sherstobitov, A. A.	en
dc.contributor.author	Zvonkov, B. N.	en
dc.contributor.author	Shashkin, V. I.	en
dc.contributor.author	Khrykin, O. I.	en
dc.contributor.author	Filatov, D. O.	en
dc.date.accessioned	2022-05-12T08:18:24Z	-
dc.date.available	2022-05-12T08:18:24Z	-
dc.date.issued	2004	-
dc.identifier.citation	Transverse Negative Magnetoresistance of Two-dimensional Structures in the Presence of a Strong In-plane Magnetic Field: Weak Localization as a Probe of Interface Roughness / G. M. Minkov, O. E. Rut, A. V. Germanenko et al. // Physical Review B - Condensed Matter and Materials Physics. — 2004. — Vol. 70. — Iss. 3. — P. 035304-1-035304-8. — 035304.	en
dc.identifier.issn	0163-1829	-
dc.identifier.other	All Open Access, Green	3
dc.identifier.uri	http://elar.urfu.ru/handle/10995/111498	-
dc.description.abstract	The interference induced transverse negative magnetoresistance of GaAs/InxGa1-xAs/GaAs quantum well heterostructures has been studied in the presence of strong in-plane magnetic field. It is shown that the effect of in-plane magnetic field is determined by the interface roughness and strongly depends on the relationship between mean free path, phase breaking length, and roughness correlation length. Analysis of the experimental results allows us to estimate parameters of short- and long-range correlated roughness which have been found in a good agreement with atomic force microscopy data obtained for just the same samples.	en
dc.description.sponsorship	This work was supported in part by the RFBR through Grant Nos. 01-02-16441, 03-02-16150, 03-02-06025, and 04-02-16626, the CRDF through Grant Nos. EK-005-X1 and Y1-P-05-11, and the Russian Program Physics of Solid State Nanostructures.	en
dc.format.mimetype	application/pdf	en
dc.language.iso	en	en
dc.publisher	American Physical Society (APS)	en
dc.rights	info:eu-repo/semantics/openAccess	en
dc.source	Phys. Rev. B Condens. Matter Mater. Phys.	2
dc.source	Physical Review B - Condensed Matter and Materials Physics	en
dc.subject	GALLIUM ARSENIDE	en
dc.subject	ARTICLE	en
dc.subject	ATOMIC FORCE MICROSCOPY	en
dc.subject	CORRELATION ANALYSIS	en
dc.subject	MAGNETIC FIELD	en
dc.subject	MAGNETISM	en
dc.subject	MATHEMATICAL COMPUTING	en
dc.subject	SURFACE PROPERTY	en
dc.title	Transverse Negative Magnetoresistance of Two-dimensional Structures in the Presence of a Strong In-plane Magnetic Field: Weak Localization as a Probe of Interface Roughness	en
dc.type	Article	en
dc.type	info:eu-repo/semantics/article	en
dc.type	info:eu-repo/semantics/submittedVersion	en
dc.identifier.scopus	42749100849	-
local.contributor.employee	Minkov, G.M., Inst. of Phys. and Appl. Mathematics, Ural State University, 620083 Ekaterinburg, Russian Federation; Rut, O.E., Inst. of Phys. and Appl. Mathematics, Ural State University, 620083 Ekaterinburg, Russian Federation; Germanenko, A.V., Inst. of Phys. and Appl. Mathematics, Ural State University, 620083 Ekaterinburg, Russian Federation; Sherstobitov, A.A., Inst. of Phys. and Appl. Mathematics, Ural State University, 620083 Ekaterinburg, Russian Federation; Zvonkov, B.N., Phys.-Technical Research Institute, University of Nizhni Novgorod, Nizhni Novgorod 603600, Russian Federation; Shashkin, V.I., Inst. Phys. Microstruct. RSA, 603600 Nizhni Novgorod, Russian Federation; Khrykin, O.I., Inst. Phys. Microstruct. RSA, 603600 Nizhni Novgorod, Russian Federation; Filatov, D.O., Res./Educ. Ctr. Phys. Solid State N., University of Nizhni Novgorod, Nizhni Novgorod 603600, Russian Federation	en
local.description.firstpage	035304	-
local.description.lastpage	1-035304-8	-
local.issue	3	-
local.volume	70	-
dc.identifier.wos	000222996700067	-
local.contributor.department	Inst. of Phys. and Appl. Mathematics, Ural State University, 620083 Ekaterinburg, Russian Federation; Phys.-Technical Research Institute, University of Nizhni Novgorod, Nizhni Novgorod 603600, Russian Federation; Inst. Phys. Microstruct. RSA, 603600 Nizhni Novgorod, Russian Federation; Res./Educ. Ctr. Phys. Solid State N., University of Nizhni Novgorod, Nizhni Novgorod 603600, Russian Federation	en
local.identifier.pure	8533024	-
local.description.order	035304	-
local.identifier.eid	2-s2.0-42749100849	-
local.fund.rffi	01-02-16441	-
local.fund.rffi	03-02-16150	-
local.fund.rffi	03-02-06025	-
local.fund.rffi	04-02-16626	-
local.identifier.wos	WOS:000222996700067	-
Располагается в коллекциях:	Научные публикации ученых УрФУ, проиндексированные в SCOPUS и WoS CC

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