Dielectric relaxation and charged domain walls in (K,Na)NbO3-based ferroelectric ceramics

Alikin, D. O.; Esin, A. A.; Turygin, A. P.; Abramov, A. S.; Hrescak, J.; Walker, J.; Rojac, T.; Bencan, A.; Malic, B.; Kholkin, A. L.; Shur, V. Ya.; Шур, В. Я.

Please use this identifier to cite or link to this item: http://elar.urfu.ru/handle/10995/104150

Title:	Dielectric relaxation and charged domain walls in (K,Na)NbO3-based ferroelectric ceramics
Authors:	Alikin, D. O. Esin, A. A. Turygin, A. P. Abramov, A. S. Hrescak, J. Walker, J. Rojac, T. Bencan, A. Malic, B. Kholkin, A. L. Shur, V. Ya. Шур, В. Я.
Issue Date:	2017
Publisher:	Ural Federal University
Citation:	Dielectric relaxation and charged domain walls in (K,Na)NbO3-based ferroelectric ceramics / D. O. Alikin, A. A. Esin, A. P. Turygin et al. // Scanning Probe Microscopy. Abstract Book of International Conference (Ekaterinburg, August 27-30, 2017). — Ekaterinburg, Ural Federal University, 2017. — 75 p.
Abstract:	We report on the evidence of significant contribution of charged domain walls to low frequency dielectric permittivity in KNN ferroelectric ceramics in the frequency range 10-106 Hz. The effect has been attributed to the Maxwell-Wagner-Sillars relaxation.
URI:	http://elar.urfu.ru/handle/10995/104150
Conference name:	International Conference "Scanning Probe Microscopy" ; International Youth Conference "Application of Scanning Probe Microscopy in Scientific Research"
Conference date:	27.08.2017-30.08.2017
ISBN:	978-5-9500624-0-7
metadata.dc.description.sponsorship:	The equipment of the Ural Center for Shared Use "Modern nanotechnology" UrFU was used.
Origin:	International Conference "Scanning Probe Microscopy" ; International Youth Conference "Application of Scanning Probe Microscopy in Scientific Research". — Ekaterinburg, 2017
Appears in Collections:	Scanning Probe Microscopy

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