Please use this identifier to cite or link to this item: http://hdl.handle.net/10995/102627
Title: Field ion microscopy of radiation damage on an atomically clean surface of materials
Authors: Ivchenko, V. A.
Issue Date: 2021
Publisher: IOP Publishing Ltd
Citation: Ivchenko V. A. Field ion microscopy of radiation damage on an atomically clean surface of materials / V. A. Ivchenko. — DOI 10.1088/1742-6596/1799/1/012011 // Journal of Physics: Conference Series. — 2021. — Vol. 1799. — Iss. 1. — 012011.
Abstract: The defects induced by neutrons (E >0.1 MeV) and Ar+ beams (E = 30 KeV) on the atomically pure surface and in the near-surface volume of platinum were studied using field ion microscopy. Experimental results of radiation defect formation in surface layers of materials initiated by neutron bombardment (Pt, E > 0.1 MeV) and ion implantation (in Cu3Au: E = 40 keV, F = 1020 ion/m2, j = 10~3 A/cm2) are considered. Quantitative estimates of the size, shape, and volume fraction of atomic displacement cascades formed during various types of irradiation in these materials are obtained. It is shown that the average size of radiation clusters after irradiation of platinum with a fast neutron fluence of 6.7« 1022 m-2 (E > 0.1 MeV) is about 3.2 nm. The experimentally established average size of a radiation cluster (disordered zone) in an alloy after ion bombardment is 4 • 4 • 1,5 nm. © Published under licence by IOP Publishing Ltd.
Keywords: ION BOMBARDMENT
ION MICROSCOPES
PLATINUM
RADIATION DAMAGE
ATOMIC DISPLACEMENT
CLEAN SURFACES
DEFECTS INDUCED
FAST NEUTRON FLUENCE
FIELD ION MICROSCOPY
NEUTRON BOMBARDMENTS
QUANTITATIVE ESTIMATES
RADIATION DEFECTS
NEUTRON IRRADIATION
URI: http://hdl.handle.net/10995/102627
Access: info:eu-repo/semantics/openAccess
SCOPUS ID: 85103175561
PURE ID: 21179812
d2432b83-4b6e-4b18-b65b-feb24b1805fe
ISSN: 17426588
DOI: 10.1088/1742-6596/1799/1/012011
Appears in Collections:Научные публикации, проиндексированные в SCOPUS и WoS CC

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