Пожалуйста, используйте этот идентификатор, чтобы цитировать или ссылаться на этот ресурс:
http://elar.urfu.ru/handle/10995/102627
Полная запись метаданных
Поле DC | Значение | Язык |
---|---|---|
dc.contributor.author | Ivchenko, V. A. | en |
dc.date.accessioned | 2021-08-31T15:04:24Z | - |
dc.date.available | 2021-08-31T15:04:24Z | - |
dc.date.issued | 2021 | - |
dc.identifier.citation | Ivchenko V. A. Field ion microscopy of radiation damage on an atomically clean surface of materials / V. A. Ivchenko. — DOI 10.1088/1742-6596/1799/1/012011 // Journal of Physics: Conference Series. — 2021. — Vol. 1799. — Iss. 1. — 012011. | en |
dc.identifier.issn | 17426588 | - |
dc.identifier.other | Final | 2 |
dc.identifier.other | All Open Access, Bronze | 3 |
dc.identifier.other | https://www.scopus.com/inward/record.uri?eid=2-s2.0-85103175561&doi=10.1088%2f1742-6596%2f1799%2f1%2f012011&partnerID=40&md5=f13f986cf1723b50a7a0c9c8aa6895f3 | |
dc.identifier.uri | http://elar.urfu.ru/handle/10995/102627 | - |
dc.description.abstract | The defects induced by neutrons (E >0.1 MeV) and Ar+ beams (E = 30 KeV) on the atomically pure surface and in the near-surface volume of platinum were studied using field ion microscopy. Experimental results of radiation defect formation in surface layers of materials initiated by neutron bombardment (Pt, E > 0.1 MeV) and ion implantation (in Cu3Au: E = 40 keV, F = 1020 ion/m2, j = 10~3 A/cm2) are considered. Quantitative estimates of the size, shape, and volume fraction of atomic displacement cascades formed during various types of irradiation in these materials are obtained. It is shown that the average size of radiation clusters after irradiation of platinum with a fast neutron fluence of 6.7« 1022 m-2 (E > 0.1 MeV) is about 3.2 nm. The experimentally established average size of a radiation cluster (disordered zone) in an alloy after ion bombardment is 4 • 4 • 1,5 nm. © Published under licence by IOP Publishing Ltd. | en |
dc.format.mimetype | application/pdf | en |
dc.language.iso | en | en |
dc.publisher | IOP Publishing Ltd | en |
dc.rights | info:eu-repo/semantics/openAccess | en |
dc.source | J. Phys. Conf. Ser. | 2 |
dc.source | Journal of Physics: Conference Series | en |
dc.subject | ION BOMBARDMENT | en |
dc.subject | ION MICROSCOPES | en |
dc.subject | PLATINUM | en |
dc.subject | RADIATION DAMAGE | en |
dc.subject | ATOMIC DISPLACEMENT | en |
dc.subject | CLEAN SURFACES | en |
dc.subject | DEFECTS INDUCED | en |
dc.subject | FAST NEUTRON FLUENCE | en |
dc.subject | FIELD ION MICROSCOPY | en |
dc.subject | NEUTRON BOMBARDMENTS | en |
dc.subject | QUANTITATIVE ESTIMATES | en |
dc.subject | RADIATION DEFECTS | en |
dc.subject | NEUTRON IRRADIATION | en |
dc.title | Field ion microscopy of radiation damage on an atomically clean surface of materials | en |
dc.type | Conference Paper | en |
dc.type | info:eu-repo/semantics/conferenceObject | en |
dc.type | info:eu-repo/semantics/publishedVersion | en |
dc.identifier.doi | 10.1088/1742-6596/1799/1/012011 | - |
dc.identifier.scopus | 85103175561 | - |
local.contributor.employee | Ivchenko, V.A., Institute of Electrophysics, Ural Branch, Russian Academy of Sciences, Yekaterinburg, 620016, Russian Federation, Yeltsin Ural Federal University, Yekaterinburg, 620002, Russian Federation | |
local.issue | 1 | - |
local.volume | 1799 | - |
local.contributor.department | Institute of Electrophysics, Ural Branch, Russian Academy of Sciences, Yekaterinburg, 620016, Russian Federation | |
local.contributor.department | Yeltsin Ural Federal University, Yekaterinburg, 620002, Russian Federation | |
local.identifier.pure | 21179812 | - |
local.identifier.pure | d2432b83-4b6e-4b18-b65b-feb24b1805fe | uuid |
local.description.order | 012011 | - |
local.identifier.eid | 2-s2.0-85103175561 | - |
Располагается в коллекциях: | Научные публикации ученых УрФУ, проиндексированные в SCOPUS и WoS CC |
Файлы этого ресурса:
Файл | Описание | Размер | Формат | |
---|---|---|---|---|
2-s2.0-85103175561.pdf | 832,24 kB | Adobe PDF | Просмотреть/Открыть |
Все ресурсы в архиве электронных ресурсов защищены авторским правом, все права сохранены.