Please use this identifier to cite or link to this item:
http://elar.urfu.ru/handle/10995/102433
Title: | Ferroelectric domain triggers the charge modulation in semiconductors (invited) |
Authors: | Morozovska, A. N. Eliseev, E. A. Ievlev, A. V. Varenyk, O. V. Pusenkova, A. S. Chu, Y. -H. Shur, V. Y. Strikha, M. V. Kalinin, S. V. Шур, В. Я. |
Issue Date: | 2014 |
Publisher: | American Institute of Physics Inc. |
Citation: | Ferroelectric domain triggers the charge modulation in semiconductors (invited) / A. N. Morozovska, E. A. Eliseev, A. V. Ievlev, et al. — DOI 10.1063/1.4891310 // Journal of Applied Physics. — 2014. — Vol. 116. — Iss. 6. — 066817. |
Abstract: | We consider a typical heterostructure "domain patterned ferroelectric film - ultra-thin dielectric layer - semiconductor," where the semiconductor can be an electrolyte, paraelectric or multi-layered graphene. Unexpectedly, we have found that the space charge modulation profile and amplitude in the semiconductor, that screens the spontaneous polarization of a 180-deg domain structure of ferroelectric, depends on the domain structure period, dielectric layer thickness and semiconductor screening radius in a rather non-trivial nonlinear way. Multiple size effects appearance and manifestation are defined by the relationship between these three parameters. In addition, we show that the concept of effective gap can be introduced in a simple way only for a single-domain limit. Obtained analytical results open the way for understanding of current-AFM maps of contaminated ferroelectric surfaces in ambient atmosphere as well as explore the possibilities of conductivity control in ultra-thin semiconductor layers. © 2014 AIP Publishing LLC. |
Keywords: | FERROELECTRIC FILMS FERROELECTRIC MATERIALS MODULATION AMBIENT ATMOSPHERE ANALYTICAL RESULTS CHARGE MODULATION FERROELECTRIC DOMAINS FERROELECTRIC SURFACES MULTI-LAYERED GRAPHENE SEMICONDUCTOR LAYERS SPONTANEOUS POLARIZATIONS FERROELECTRICITY |
URI: | http://elar.urfu.ru/handle/10995/102433 |
Access: | info:eu-repo/semantics/openAccess |
SCOPUS ID: | 84906309082 |
WOS ID: | 000341179400095 |
PURE ID: | a269de16-2260-45a9-bae8-cf11f05225ee 412790 |
ISSN: | 218979 |
DOI: | 10.1063/1.4891310 |
Appears in Collections: | Научные публикации ученых УрФУ, проиндексированные в SCOPUS и WoS CC |
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