Please use this identifier to cite or link to this item: http://elar.urfu.ru/handle/10995/102261
Title: Crystal stabilization of α-FAPbI3perovskite by rapid annealing method in industrial scale
Authors: Murugadoss, G.
Arunachalam, P.
Panda, S. K.
Rajesh, Kumar, M.
Rajabathar, J. R.
Al-Lohedan, H.
Wasmiah, M. D.
Issue Date: 2021
Publisher: Elsevier Editora Ltda
Citation: Crystal stabilization of α-FAPbI3perovskite by rapid annealing method in industrial scale / G. Murugadoss, P. Arunachalam, S. K. Panda, et al. — DOI 10.1016/j.jmrt.2021.03.107 // Journal of Materials Research and Technology. — 2021. — Vol. 12. — P. 1924-1930.
Abstract: Organic-inorganic hybrid formamidinium lead iodide (FAPbI3) perovskite has shown tremendous attention in recently developed photovoltaics and optelectronic devices. However, it suffers from structural instability complications, particularly the spontaneous phase transition from a dark color photoactive perovskite phase (α-FAPbI3) to a yellow color photo-inactive phase (δ-FAPbI3) at room temperature. To stabilize the photoactive α-FAPbI3, several methods were employed, including compositional engineering, 2D layer deposition on the surface, and solvent engineering method. In this communication, we have proposed a facile sequential rapid annealing method to produce the photoactive α-FAPbI3 perovskite on an industrial scale, which is highly stable at room temperature. The structural, morphological, compositional, and optical properties of the perovskite were studied using X-ray diffraction (XRD), UV-visible absorption, Laser Raman, thermogravimetric analysis (TGA), and field emission electron microscopy with elemental analysis (FE-SEM & EDAX). The strong characteristic diffraction peaks of cubic structure in XRD showed the proposed additives free preparation method is more adaptable for the preparation of high quality α-FAPbI3 perovskite for optoelectronic applications. © 2021 The Author(s).
Keywords: MICROSTRUCTURE
PHASE CHANGE/STABILITY
RAPID ANNEALING
X-RAY TECHNIQUES
Α-FAPBI3
ADDITIVES
ANNEALING
CRYSTAL STRUCTURE
IODINE COMPOUNDS
LAYERED SEMICONDUCTORS
LEAD COMPOUNDS
OPTICAL PROPERTIES
ORGANIC-INORGANIC MATERIALS
PEROVSKITE
QUALITY CONTROL
THERMOGRAVIMETRIC ANALYSIS
X RAY DIFFRACTION
ANNEALING METHODS
CRYSTAL STABILIZATION
INDUSTRIAL SCALE
LEAD IODIDE
ORGANIC/INORGANIC HYBRIDS
PHASE CHANGE/STABILITY
RAPID ANNEALING
X- RAY DIFFRACTIONS
X-RAY TECHNIQUES
Α-FAPBI3
MICROSTRUCTURE
URI: http://elar.urfu.ru/handle/10995/102261
Access: info:eu-repo/semantics/openAccess
RSCI ID: 46818646
SCOPUS ID: 85106940338
WOS ID: 000654677100005
PURE ID: 22093925
9c4be19c-db07-4f9c-a746-e251bcd8e3cc
ISSN: 22387854
DOI: 10.1016/j.jmrt.2021.03.107
metadata.dc.description.sponsorship: Dr. G. Murugadoss acknowledges to the management of Sathyabama Institute of Science and Technology, Chennai, Tamilnadu, India for provided lab facility. We extend their appreciation to the Deputyship for Research & Innovation, “Ministry of Education” in Saudi Arabia for funding this research work through the project no. ( IFKSURG-1440-014 ).
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