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http://elar.urfu.ru/handle/10995/101691
Title: | Bulk In2O3 crystals grown by chemical vapour transport: a combination of XPS and DFT studies |
Authors: | Zatsepin, D. A. Boukhvalov, D. W. Zatsepin, A. F. Vines, L. Gogova, D. Shur, V. Y. Esin, A. A. Шур, В. Я. |
Issue Date: | 2019 |
Publisher: | Springer New York LLC |
Citation: | Bulk In2O3 crystals grown by chemical vapour transport: a combination of XPS and DFT studies / D. A. Zatsepin, D. W. Boukhvalov, A. F. Zatsepin, et al. — DOI 10.1007/s10854-019-02228-6 // Journal of Materials Science: Materials in Electronics. — 2019. — Vol. 30. — Iss. 20. — P. 18753-18758. |
Abstract: | High purity In2O3 crystals were synthesized by the chemical vapour transport (CVT) as confirmed by X-ray Photoelectron Spectroscopy (XPS) using survey, core-levels and valence band scans of the samples. Further, high energy resolution XPS spectra revealed perfectly bonded In 3d configuration and excluded the presence of metallic In0, concurrently, the dual band observed for O 1s configuration was interpreted in term of the additional defectiveness in the oxygen sublattice. The valence band as measured by XPS is in agreement with the calculated one using DFT approach, and an insignificant shift of valence band toward Fermi level (about 0.05 eV) caused by the presence of the defects was established. Moreover, the energetics of the primarily defects were calculated and the trends were set in the perspective of XPS measurements. Altogether we make CVT In2O3 crystals ready to be used for the onward studies and technical applications. © 2019, Springer Science+Business Media, LLC, part of Springer Nature. |
Keywords: | DEFECTS VALENCE BANDS VARIABLE SPEED TRANSMISSIONS X RAY PHOTOELECTRON SPECTROSCOPY 3D CONFIGURATIONS CHEMICAL VAPOUR TRANSPORT HIGH PURITY HIGH-ENERGY RESOLUTION OXYGEN SUBLATTICES TECHNICAL APPLICATIONS XPS MEASUREMENTS XPS SPECTRA INDIUM COMPOUNDS |
URI: | http://elar.urfu.ru/handle/10995/101691 |
Access: | info:eu-repo/semantics/openAccess |
SCOPUS ID: | 85073596597 |
WOS ID: | 000490627900043 |
PURE ID: | 5f8989d3-33a5-447e-b927-3793b6c40663 11114680 |
ISSN: | 9574522 |
DOI: | 10.1007/s10854-019-02228-6 |
Appears in Collections: | Научные публикации ученых УрФУ, проиндексированные в SCOPUS и WoS CC |
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