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ISSN:
2310-757X
Электронный научный архив УрФУ
Browsing by Author Rezvan, A. A.
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Showing results 3 to 5 of 5
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Issue Date
Title
Author(s)
2018
Local anodic oxidation by the probe method as a surface modification method for nanoscale profiling
Rezvan, A. A.
;
Klimin, V. S.
2018
Masking layer formation on silicon substrate by the focused ion beams method for plasma-chemical treatment
Kots, I. N.
;
Klimin, V. S.
;
Rezvan, A. A.
;
Polyakova, V. V.
;
Ageev, O. A.
2018
Study of formation of high aspect GaAs structures based on the method of focused ion beams
Rezvan, A. A.
;
Klimin, V. S.
;
Solodovnik, M. S.