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http://elar.urfu.ru/handle/10995/80821
Title: | Use of EELS STEM technique to estimate the depth profile of tungsten oxide reduction under proton irradiation |
Authors: | Dementyeva, M. M. Prikhodko, K. E. Gurovich, B. A. Kutuzov, L. V. Komarov, D. A. |
Issue Date: | 2018 |
Publisher: | Ural Federal University |
Citation: | Use of EELS STEM technique to estimate the depth profile of tungsten oxide reduction under proton irradiation / M. M. Dementyeva, K. E. Prikhodko, B. A. Gurovich, L. V. Kutuzov, D. A. Komarov // Scanning Probe Microscopy. Abstract Book of International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2018. — p. 114-115. |
URI: | http://elar.urfu.ru/handle/10995/80821 |
Conference name: | International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials" |
Conference date: | 26.08.2018-29.08.2018 |
ISBN: | 978-5-9500624-1-4 |
Origin: | International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials". — Ekaterinburg, 2018 |
Appears in Collections: | Scanning Probe Microscopy |
Files in This Item:
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978-5-9500624-1-4_2018_081.pdf | 359,28 kB | Adobe PDF | View/Open |
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