ISSN: 2310-757X
Please use this identifier to cite or link to this item:
https://elar.urfu.ru/handle/10995/80814| Title: | Electron-beam and AFM domain writing in the relaxor ferroelectric SBN |
| Authors: | Bodnarchuk, Ya. V. Volk, T. R. Kochanchik, L. S. Gainutdinov, R. V. Ivleva, L. I. |
| Issue Date: | 2018 |
| Publisher: | Ural Federal University |
| Citation: | Electron-beam and AFM domain writing in the relaxor ferroelectric SBN / Ya. V. Bodnarchuk, T. R. Volk, L. S. Kochanchik, R. V. Gainutdinov, L. I. Ivleva // Scanning Probe Microscopy. Abstract Book of International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2018. — p. 105-106. |
| URI: | http://elar.urfu.ru/handle/10995/80814 |
| Conference name: | International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials" |
| Conference date: | 26.08.2018-29.08.2018 |
| ISBN: | 978-5-9500624-1-4 |
| Sponsorship: | This work was supported by the Russian Foundation for Basic Researches (projects Nos. 16-29-11777ofi-m and 16-0200439a). |
| Origin: | International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials". — Ekaterinburg, 2018 |
| Appears in Collections: | Scanning Probe Microscopy |
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| File | Description | Size | Format | |
|---|---|---|---|---|
| 978-5-9500624-1-4_2018_075.pdf | 488,14 kB | Adobe PDF | View/Open |
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