1. Электронный научный архив УрФУ
  2. 00. Общеуниверситетские коллекции
  3. Конференции, семинары, сборники
  4. Scanning Probe Microscopy
Please use this identifier to cite or link to this item: https://elar.urfu.ru/handle/10995/80814
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dc.contributor.authorBodnarchuk, Ya. V.en
dc.contributor.authorVolk, T. R.en
dc.contributor.authorKochanchik, L. S.en
dc.contributor.authorGainutdinov, R. V.en
dc.contributor.authorIvleva, L. I.en
dc.date.accessioned2020-03-24T06:59:47Z-
dc.date.available2020-03-24T06:59:47Z-
dc.date.issued2018-
dc.identifier.citationElectron-beam and AFM domain writing in the relaxor ferroelectric SBN / Ya. V. Bodnarchuk, T. R. Volk, L. S. Kochanchik, R. V. Gainutdinov, L. I. Ivleva // Scanning Probe Microscopy. Abstract Book of International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2018. — p. 105-106.en
dc.identifier.isbn978-5-9500624-1-4-
dc.identifier.urihttp://elar.urfu.ru/handle/10995/80814-
dc.description.sponsorshipThis work was supported by the Russian Foundation for Basic Researches (projects Nos. 16-29-11777ofi-m and 16-0200439a).en
dc.format.mimetypeapplication/pdfen
dc.language.isoenen
dc.publisherUral Federal Universityen
dc.relation.ispartofInternational Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials". — Ekaterinburg, 2018en
dc.titleElectron-beam and AFM domain writing in the relaxor ferroelectric SBNen
dc.typeConference Paperen
dc.typeinfo:eu-repo/semantics/conferenceObjecten
dc.typeinfo:eu-repo/semantics/publishedVersionen
dc.conference.nameInternational Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials"en
dc.conference.date26.08.2018-29.08.2018-
local.description.firstpage105-
local.description.lastpage106-
local.description.orderP-16-
Appears in Collections:Scanning Probe Microscopy

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