Please use this identifier to cite or link to this item: http://elar.urfu.ru/handle/10995/80760
Title: Scanning probe microscopy under ultra high vacuum: Technologies and advantages from Scienta Omicron
Authors: Trusov, M. A.
Minin, M. G.
Issue Date: 2018
Publisher: Ural Federal University
Citation: Trusov M. A. Scanning probe microscopy under ultra high vacuum: Technologies and advantages from Scienta Omicron / M. A. Trusov, M. G. Minin // Scanning Probe Microscopy. Abstract Book of International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2018. — p. 37.
URI: http://elar.urfu.ru/handle/10995/80760
Conference name: International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials"
Conference date: 26.08.2018-29.08.2018
ISBN: 978-5-9500624-1-4
Origin: International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials". — Ekaterinburg, 2018
Appears in Collections:Scanning Probe Microscopy

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