ISSN: 2310-757X
Please use this identifier to cite or link to this item:
http://elar.urfu.ru/handle/10995/80720| Title: | Microstructure and electrical properties of thin SiC films on Si substrates of p- and n-types |
| Authors: | Sergeeva, O. N. Solnyshkin, A. V. Nekrasova, G. M. Senkevich, S. V. Pronin, I. P. Kukushkin, S. A. |
| Issue Date: | 2018 |
| Publisher: | Ural Federal University |
| Citation: | Microstructure and electrical properties of thin SiC films on Si substrates of p- and n-types / O. N. Sergeeva, A. V. Solnyshkin, G. M. Nekrasova, S. V. Senkevich, I. P. Pronin, S. A. Kukushkin // Scanning Probe Microscopy. Abstract Book of International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2018. — p. 195. |
| URI: | http://elar.urfu.ru/handle/10995/80720 |
| Conference name: | International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials" |
| Conference date: | 26.08.2018-29.08.2018 |
| ISBN: | 978-5-9500624-1-4 |
| Origin: | International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials". — Ekaterinburg, 2018 |
| Appears in Collections: | Scanning Probe Microscopy |
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| File | Description | Size | Format | |
|---|---|---|---|---|
| 978-5-9500624-1-4_2018_140.pdf | 359,74 kB | Adobe PDF | View/Open |
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