Please use this identifier to cite or link to this item: http://elar.urfu.ru/handle/10995/80697
Title: Electrical properties and polarization switching in polycrystalline BiFeO3 thin films
Authors: Araujo, E. B.
Alikin, D. O.
Reis, S. P.
Shur, V. Ya.
Kholkin, A. L.
Шур, В. Я.
Issue Date: 2018
Publisher: Ural Federal University
Citation: Electrical properties and polarization switching in polycrystalline BiFeO3 thin films / E. B. Araujo, D. O. Alikin, S. P. Reis, V. Ya. Shur, A. L. Kholkin // Scanning Probe Microscopy. Abstract Book of International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2018. — p. 21.
URI: http://elar.urfu.ru/handle/10995/80697
Conference name: International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials"
Conference date: 26.08.2018-29.08.2018
ISBN: 978-5-9500624-1-4
Origin: International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials". — Ekaterinburg, 2018
Appears in Collections:Scanning Probe Microscopy

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