Please use this identifier to cite or link to this item: http://hdl.handle.net/10995/80686
Title: Stick and slip states in the probe-sample force interaction and informative nanomechanical measurements using AFM
Authors: Ankudinov, A. V.
Issue Date: 2018
Publisher: Ural Federal University
Citation: Ankudinov A. V. Stick and slip states in the probe-sample force interaction and informative nanomechanical measurements using AFM / A. V. Ankudinov // Scanning Probe Microscopy. Abstract Book of International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2018. — p. 19-20.
URI: http://hdl.handle.net/10995/80686
Conference name: International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials"
Conference date: 26.08.2018-29.08.2018
ISBN: 978-5-9500624-1-4
metadata.dc.description.sponsorship: The work was supported by FTP № 14.604.21.0200 (RFMEFI60417X0200).
Origin: International Conference "Scanning Probe Microscopy" ; International Workshop "Modern Nanotechnologies" ; International Youth Conference "Functional Imaging of Nanomaterials". — Ekaterinburg, 2018
Appears in Collections:Scanning Probe Microscopy

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