ISSN: 2310-757X
Please use this identifier to cite or link to this item:
http://elar.urfu.ru/handle/10995/79201| Title: | Advanced integrated solutions based on atomic-force microscopy |
| Authors: | Vysokikh, Yu. E. Krasnoborodko, S. Yu. Kozodaev, D. А. |
| Issue Date: | 2019 |
| Publisher: | Ural Federal University |
| Citation: | Vysokikh Yu. E. Advanced integrated solutions based on atomic-force microscopy / Yu. E. Vysokikh, S. Yu. Krasnoborodko, D. А. Kozodaev // Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. Abstract Book of Joint International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2019. — P. 74. |
| URI: | http://elar.urfu.ru/handle/10995/79201 |
| Conference name: | 3rd International Conference "Scanning Probe Microscopy" ; 4th Russia-China Workshop on Dielectric and Ferroelectric Materials ; International Youth Conference "Functional Imaging of nanomaterials" |
| Conference date: | 25.08.2019-28.08.2019 |
| ISBN: | 978-5-9500624-2-1 |
| Origin: | Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. — Ekaterinburg, 2019 |
| Appears in Collections: | Scanning Probe Microscopy |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 978-5-9500624-2-1_2019_059.pdf | 156,33 kB | Adobe PDF | View/Open |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.