Please use this identifier to cite or link to this item: http://hdl.handle.net/10995/79158
Title: High-aspect ratio probes with selected geometry for advanced MFM measurements
Authors: Zhukov, M. V.
Belousov, K. I.
Golubok, A. O.
Issue Date: 2019
Publisher: Ural Federal University
Citation: Zhukov M. V. High-aspect ratio probes with selected geometry for advanced MFM measurements / M. V. Zhukov, K. I. Belousov, A. O. Golubok // Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. Abstract Book of Joint International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2019. — P. 294-295.
URI: http://hdl.handle.net/10995/79158
Conference name: 3rd International Conference "Scanning Probe Microscopy" ; 4th Russia-China Workshop on Dielectric and Ferroelectric Materials ; International Youth Conference "Functional Imaging of nanomaterials"
Conference date: 25.08.2019-28.08.2019
ISBN: 978-5-9500624-2-1
metadata.dc.description.sponsorship: The authors appreciate financial support by Ministry of Education and Science of the Russian Federation, Russia, State Project № 075-00780-19-00, Subject № 0074-2019-0007.
Origin: Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. — Ekaterinburg, 2019
Appears in Collections:Scanning Probe Microscopy

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