Please use this identifier to cite or link to this item: http://hdl.handle.net/10995/79158
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dc.contributor.authorZhukov, M. V.en
dc.contributor.authorBelousov, K. I.en
dc.contributor.authorGolubok, A. O.en
dc.date.accessioned2019-12-19T12:26:18Z-
dc.date.available2019-12-19T12:26:18Z-
dc.date.issued2019-
dc.identifier.citationZhukov M. V. High-aspect ratio probes with selected geometry for advanced MFM measurements / M. V. Zhukov, K. I. Belousov, A. O. Golubok // Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. Abstract Book of Joint International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2019. — P. 294-295.en
dc.identifier.isbn978-5-9500624-2-1-
dc.identifier.urihttp://hdl.handle.net/10995/79158-
dc.description.sponsorshipThe authors appreciate financial support by Ministry of Education and Science of the Russian Federation, Russia, State Project № 075-00780-19-00, Subject № 0074-2019-0007.en
dc.format.mimetypeapplication/pdfen
dc.language.isoenen
dc.publisherUral Federal Universityen
dc.relation.ispartofScanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. — Ekaterinburg, 2019en
dc.titleHigh-aspect ratio probes with selected geometry for advanced MFM measurementsen
dc.typeConference Paperen
dc.typeinfo:eu-repo/semantics/conferenceObjecten
dc.typeinfo:eu-repo/semantics/publishedVersionen
dc.conference.name3rd International Conference "Scanning Probe Microscopy" ; 4th Russia-China Workshop on Dielectric and Ferroelectric Materials ; International Youth Conference "Functional Imaging of nanomaterials"en
dc.conference.date25.08.2019-28.08.2019-
local.description.firstpage294-
local.description.lastpage295-
Appears in Collections:Scanning Probe Microscopy

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