Piezoresponse force microscopy and electron backscattering diffraction of 90° ferroelectric twins in BaTiO3 positive temperature coefficient (PTC) thermistors

Tofail, S. A. M.; Karimi-Jafari, M.; Stapleton, A.; Guo, Y.; Kowal, K.; Chovan, D.; Kailas, L.; Gandhi, A.; O’Sullivan, K.; Maher, A.; Silien, C.; Ul-Haq, E.

Please use this identifier to cite or link to this item: http://elar.urfu.ru/handle/10995/79007

Title:	Piezoresponse force microscopy and electron backscattering diffraction of 90° ferroelectric twins in BaTiO3 positive temperature coefficient (PTC) thermistors
Authors:	Tofail, S. A. M. Karimi-Jafari, M. Stapleton, A. Guo, Y. Kowal, K. Chovan, D. Kailas, L. Gandhi, A. O’Sullivan, K. Maher, A. Silien, C. Ul-Haq, E.
Issue Date:	2019
Publisher:	Ural Federal University
Citation:	Piezoresponse force microscopy and electron backscattering diffraction of 90° ferroelectric twins in BaTiO3 positive temperature coefficient (PTC) thermistors / S. A. M. Tofail, M. Karimi-Jafari, A. Stapleton, Y. Guo, K. Kowal, D. Chovan, L. Kailas, A. Gandhi, K. O’Sullivan, A. Maher, C. Silien, E. Ul-Haq // Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. Abstract Book of Joint International Conference (Ekaterinburg, August 25-28, 2019). — Ekaterinburg, Ural Federal University, 2019. — P. 16.
URI:	http://elar.urfu.ru/handle/10995/79007
Conference name:	3rd International Conference "Scanning Probe Microscopy" ; 4th Russia-China Workshop on Dielectric and Ferroelectric Materials ; International Youth Conference "Functional Imaging of nanomaterials"
Conference date:	25.08.2019-28.08.2019
ISBN:	978-5-9500624-2-1
Sponsorship:	The authors acknowledge funding from the European Union's Horizon 2020 research and innovation program, OYSTER (Open characterisation and modelling environment to drive innovation in advanced nanoarchitectured and bio-inspired hard/soft interfaces) under grant agreement No 760827, Enterprise Ireland, Innovation Partnership Programme (Project No: IP/2013/0281), Irish Research Council postgraduate scholarship and Higher Education Authority (HEA).
Origin:	Scanning Probe Microscopy. Russia-China Workshop on Dielectric and Ferroelectric Materials. — Ekaterinburg, 2019
Appears in Collections:	Scanning Probe Microscopy

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