Please use this identifier to cite or link to this item: http://hdl.handle.net/10995/51560
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dc.contributor.authorSokolov, V. I.en
dc.contributor.authorPustovarov, V. A.en
dc.contributor.authorChurmanov, V. N.en
dc.contributor.authorIvanov, V. Yu.en
dc.contributor.authorGruzdev, N. B.en
dc.contributor.authorSokolov, P. S.en
dc.contributor.authorBaranov, A. N.en
dc.contributor.authorMoskvin, A. S.en
dc.contributor.authorПустоваров, В. А.ru
dc.date.accessioned2017-09-04T14:46:08Z-
dc.date.available2017-09-04T14:46:08Z-
dc.date.issued2012-
dc.identifier.citationSelf-trapping of the d-d charge transfer exciton in bulk NiO evidenced by X-ray excited luminescence / V. I. Sokolov, V. A. Pustovarov, V. N. Churmanov, V. Yu. Ivanov, N. B. Gruzdev, P. S. Sokolov, A. N. Baranov, A. S. Moskvin // JETP Letters. — 2012. — Vol. 95. — № 10. — P. 528-533.en
dc.identifier.issn0021-3640-
dc.identifier.other1good_DOI
dc.identifier.other1b061624-f4ff-45ed-9558-984b18a626depure_uuid
dc.identifier.otherhttp://www.scopus.com/inward/record.url?partnerID=8YFLogxK&scp=84864390747m
dc.identifier.urihttp://hdl.handle.net/10995/51560-
dc.identifier.urihttps://elar.urfu.ru/handle/10995/51560en
dc.description.abstractSoft X-ray (XUV) excitation did make it possible to avoid the predominant role of the surface effects in luminescence of NiO and revealed a bulk luminescence with a puzzling well isolated doublet of very narrow lines with close energies near 3. 3 eV which is assigned to recombination transitions in self-trapped d-d charge transfer (CT) excitons formed by coupled Jahn-Teller Ni + and Ni 3+ centers. The conclusion is supported both by a comparative analysis of the CT luminescence spectra for NiO and solid solutions Ni xZn 1 - xO, and by a comprehensive cluster model assignment of different p-d and d-d CT transitions, their relaxation channels. To the best of our knowledge, it is the first observation of the luminescence due to self-trapped d-d CT excitons. © 2012 Pleiades Publishing, Ltd.en
dc.format.mimetypeapplication/pdfen
dc.language.isoenen
dc.rightsinfo:eu-repo/semantics/restrictedAccessen
dc.sourceJETP Lettersen
dc.titleSelf-trapping of the d-d charge transfer exciton in bulk NiO evidenced by X-ray excited luminescenceen
dc.typeArticleen
dc.typeinfo:eu-repo/semantics/publishedVersionen
dc.typeinfo:eu-repo/semantics/articleen
dc.identifier.rsi20475097-
dc.identifier.doi10.1134/S0021364012100116-
dc.identifier.scopus84864390747-
local.contributor.employeeСоколов Виктор Ивановичru
local.contributor.employeeПустоваров Владимир Алексеевичru
local.contributor.employeeЧурманов Владимир Николаевичru
local.contributor.employeeИванов Владимир Юрьевичru
local.contributor.employeeМосквин Александр Сергеевичru
local.description.firstpage528-
local.description.lastpage533-
local.issue10-
local.volume95-
dc.identifier.wos000306950800007-
local.contributor.departmentИнститут естественных наук и математикиru
local.contributor.departmentФизико-технологический институтru
local.identifier.pure1079637-
local.identifier.eid2-s2.0-84864390747-
local.identifier.wosWOS:000306950800007-
Appears in Collections:Научные публикации, проиндексированные в SCOPUS и WoS CC

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