Domain kinetics in lithium niobate single crystals with photoresist dielectric layer

Abstract

The influence of the artificial surface layer (photoresist film) on the domain kinetics was studied in congruent lithium niobate single crystals. The switching current data wasfitted by modified Kolmogorov-Avrami formula. The qualitative change of the domain structure evolution for photoresist film thickness above 2 μm was revealed by in situ optical visualization and analysis of the switching current data. The linear dependence of the threshold field increase on the film thickness was found. The quasi-regular nanodomain structures on Z+ polar surface were studied by scanning probe and Raman confocal microscopy and the domain evolution scenario was revealed. Copyright © Taylor & Francis Group, LLC.