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http://elar.urfu.ru/handle/10995/27487
Полная запись метаданных
Поле DC | Значение | Язык |
---|---|---|
dc.contributor.author | Shtennikov, V. N. | en |
dc.contributor.author | Budai, B. T. | en |
dc.date.accessioned | 2014-11-29T19:47:44Z | - |
dc.date.available | 2014-11-29T19:47:44Z | - |
dc.date.issued | 2013 | - |
dc.identifier.citation | Shtennikov V. N. The development of the physical fundamentals of contact soldering as a factor for reducing the number of defects in electronic devices / V. N. Shtennikov, B. T. Budai // Russian Journal of Nondestructive Testing. — 2013. — Vol. 49. — № 3. — P. 178-183. | en |
dc.identifier.issn | 1061-8309 | - |
dc.identifier.other | 1 | good_DOI |
dc.identifier.other | d1d401db-f9c0-45eb-8ea4-365905401282 | pure_uuid |
dc.identifier.other | http://www.scopus.com/inward/record.url?partnerID=8YFLogxK&scp=84879292647 | m |
dc.identifier.uri | http://elar.urfu.ru/handle/10995/27487 | - |
dc.description.abstract | Automated control systems employ electronic components that are connected with a printed circuit board (PCB) by soldered joints. At elevated temperatures and with high vibration levels, soldering defects may occur that are characterized by the deterioration or complete loss of contact with the PCB, which can lead to the failure of the system. In this work, an approach is proposed to considerably improve the reliability of soldered joints. © 2013 Pleiades Publishing, Ltd. | en |
dc.format.mimetype | application/pdf | en |
dc.language.iso | en | en |
dc.source | Russian Journal of Nondestructive Testing | en |
dc.subject | COMPARISON | en |
dc.subject | DEFECT | en |
dc.subject | DIAGNOSTICS | en |
dc.subject | HEAT TRANSFER | en |
dc.subject | QUALITY | en |
dc.subject | SOLDERING | en |
dc.subject | AUTOMATED CONTROL SYSTEMS | en |
dc.subject | COMPARISON | en |
dc.subject | ELECTRONIC COMPONENT | en |
dc.subject | ELECTRONIC DEVICE | en |
dc.subject | ELEVATED TEMPERATURE | en |
dc.subject | PRINTED CIRCUIT BOARDS (PCB) | en |
dc.subject | VIBRATION LEVEL | en |
dc.subject | DEFECTS | en |
dc.subject | HEAT TRANSFER | en |
dc.subject | IMAGE QUALITY | en |
dc.subject | ORGANIC POLLUTANTS | en |
dc.subject | PLASMA DIAGNOSTICS | en |
dc.subject | SOLDERED JOINTS | en |
dc.subject | SOLDERING | en |
dc.title | The development of the physical fundamentals of contact soldering as a factor for reducing the number of defects in electronic devices | en |
dc.type | Article | en |
dc.type | info:eu-repo/semantics/publishedVersion | en |
dc.type | info:eu-repo/semantics/article | en |
dc.identifier.doi | 10.1134/S1061830913030078 | - |
dc.identifier.scopus | 84879292647 | - |
local.affiliation | El'Tsin Ural Federal University, Yekaterinburg, Russian Federation | en |
local.affiliation | Physico-Technical Institute, El'Tsin Ural Federal University, Yekaterinburg, Russian Federation | en |
local.contributor.employee | Штенников Василий Николаевич | ru |
local.contributor.employee | Будаи Борис Тиборович | ru |
dc.identifier.wos | 000320475200007 | - |
local.contributor.department | Институт радиоэлектроники и информационных технологий - РтФ | ru |
local.contributor.department | Физико-технологический институт | ru |
local.identifier.pure | 912570 | - |
local.identifier.eid | 2-s2.0-84879292647 | - |
local.identifier.wos | WOS:000320475200007 | - |
Располагается в коллекциях: | Научные публикации ученых УрФУ, проиндексированные в SCOPUS и WoS CC |
Файлы этого ресурса:
Файл | Описание | Размер | Формат | |
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scopus-2013-0633.pdf | 820,44 kB | Adobe PDF | Просмотреть/Открыть |
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