Please use this identifier to cite or link to this item: http://elar.urfu.ru/handle/10995/27163
Title: Impurity phases in beryllium oxide ceramic
Authors: Turnaev, S. K.
Bitsoev, G. D.
Kil'govatov, G. M.
Kiiko, V. S.
Issue Date: 2013
Citation: Impurity phases in beryllium oxide ceramic / S. K. Turnaev, G. D. Bitsoev, G. M. Kil'govatov [et al.] // Refractories and Industrial Ceramics. — 2013. — Vol. 53. — № 5. — P. 338-344.
Abstract: An x-ray spectrographic method with an electron probe and a scanning electron microscope are used to study industrial ceramic specimen surface composition, distinguished by presence of a different color for both the main part, and impurity phases. BeO-ceramic specimens, having a visually differing color, are conditionally separated into three types. In reflected electron microphotographs impurities are distinguished qualitatively with respect to electrical conductivity. Iron impurity is invariably present within the composition of electrically conducting phases and inclusions. Apart from iron, all impurity phases contain carbon, aluminum, silicon, and calcium, and within individual phases there are admixtures of manganese, magnesium, chromium, potassium, sodium, zinc, phosphorus, and chlorine, which may be introduced into BeO-ceramic during production and sintering in repeatedly used industrial furnaces from linings and residual atmosphere. © 2013 Springer Science+Business Media New York.
Keywords: BEO-CERAMIC
COLOR OF IMPURITY PHASES IN REFLECTED ELECTRONS
ELECTRICALLY CONDUCTING PHASES
IMPURITY PHASES
INCLUSIONS
MICROSTRUCTURE
PHASE COMPOSITION
SPECIMENS
BEO-CERAMIC
CONDUCTING PHASIS
ELECTRICAL CONDUCTIVITY
ELECTRON PROBE
IMPURITY PHASIS
IRON IMPURITIES
SCANNING ELECTRON MICROSCOPE
SPECIMENS
CERAMIC MATERIALS
COLOR
ELECTRIC CONDUCTIVITY
ELECTRON REFLECTION
INCLUSIONS
MICROSTRUCTURE
PHASE COMPOSITION
SCANNING ELECTRON MICROSCOPY
SINTERING
IMPURITIES
URI: http://elar.urfu.ru/handle/10995/27163
RSCI ID: 20437690
SCOPUS ID: 84876665712
WOS ID: 000317990200013
PURE ID: 878691
ISSN: 1083-4877
1573-9139
DOI: 10.1007/s11148-013-9523-9
Appears in Collections:Научные публикации ученых УрФУ, проиндексированные в SCOPUS и WoS CC

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