Domain structure imaging in PMN-PT crystals using channelling-contrast backscattered electron microscopy

Abstract

We demonstrate the abilities of various SEM techniques for domain imaging in PMN-PT crystals with different compositions. It is shown that the imaging of the chemically etched relief is limited by its destructivity and potential contrast - by low resolution and contrast instability. The optimal parameters of the imaging by backscattered electron channelling allow obtaining the high-resolution domain imaging in PMN-PT crystals. The domain structure change as a result of the phase transition are imaged. The correlation between the images of the surface domain structure obtained by scanning electron microscopy and piezoresponse force microscopy is demonstrated. © 2018 Institute of Physics Publishing. All rights reserved.