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http://elar.urfu.ru/handle/10995/130606
Название: | Au-Hyperdoped Si Nanolayer: Laser Processing Techniques and Corresponding Material Properties |
Авторы: | Kovalev, M. Nastulyavichus, A. Podlesnykh, I. Stsepuro, N. Pryakhina, V. Greshnyakov, E. Serdobintsev, A. Gritsenko, I. Khmelnitskii, R. Kudryashov, S. |
Дата публикации: | 2023 |
Издатель: | MDPI |
Библиографическое описание: | Kovalev, M, Nastulyavichus, A, Podlesnykh, I, Stsepuro, N, Pryakhina, V, Greshnyakov, E, Serdobintsev, A, Gritsenko, I, Khmelnitskii, R & Kudryashov, S 2023, 'Au-Hyperdoped Si Nanolayer: Laser Processing Techniques and Corresponding Material Properties', Materials, Том. 16, № 12, 4439. https://doi.org/10.3390/ma16124439 Kovalev, M., Nastulyavichus, A., Podlesnykh, I., Stsepuro, N., Pryakhina, V., Greshnyakov, E., Serdobintsev, A., Gritsenko, I., Khmelnitskii, R., & Kudryashov, S. (2023). Au-Hyperdoped Si Nanolayer: Laser Processing Techniques and Corresponding Material Properties. Materials, 16(12), [4439]. https://doi.org/10.3390/ma16124439 |
Аннотация: | The absorption of light in the near-infrared region of the electromagnetic spectrum by Au-hyperdoped Si has been observed. While silicon photodetectors in this range are currently being produced, their efficiency is low. Here, using the nanosecond and picosecond laser hyperdoping of thin amorphous Si films, their compositional (energy-dispersion X-ray spectroscopy), chemical (X-ray photoelectron spectroscopy), structural (Raman spectroscopy) and IR spectroscopic characterization, we comparatively demonstrated a few promising regimes of laser-based silicon hyperdoping with gold. Our results indicate that the optimal efficiency of impurity-hyperdoped Si materials has yet to be achieved, and we discuss these opportunities in light of our results. © 2023 by the authors. |
Ключевые слова: | AMORPHOUS SI FILM ENERGY-DISPERSIVE X-RAY MICROSPECTROSCOPY GOLD IMPURITY IR SPECTROSCOPY LASER HYPERDOPING RAMAN MICROSPECTROSCOPY X-RAY PHOTOELECTRON MICROSPECTROSCOPY ABSORPTION SPECTROSCOPY GOLD INFRARED DEVICES PHOTODETECTORS PHOTONS SILICON X RAY PHOTOELECTRON SPECTROSCOPY AMORPHOUS SI FILMS ENERGY-DISPERSIVE X-RAY MICROSPECTROSCOPY ENERGY-DISPERSIVE X-RAYS GOLD IMPURITIES IR-SPECTROSCOPY LASER HYPERDOPING MICRO SPECTROSCOPY RAMAN MICROSPECTROSCOPY X-RAY MICROSPECTROSCOPY X-RAY PHOTOELECTRON MICROSPECTROSCOPY X-RAY PHOTOELECTRONS INFRARED SPECTROSCOPY |
URI: | http://elar.urfu.ru/handle/10995/130606 |
Условия доступа: | info:eu-repo/semantics/openAccess cc-by |
Текст лицензии: | https://creativecommons.org/licenses/by/4.0/ |
Идентификатор SCOPUS: | 85163879301 |
Идентификатор WOS: | 001017415400001 |
Идентификатор PURE: | 41557486 |
ISSN: | 1996-1944 |
DOI: | 10.3390/ma16124439 |
Сведения о поддержке: | Ministry of Education and Science of the Russian Federation, Minobrnauka; Russian Science Foundation, RSF: 21-72-00116; Ministry of Science and Higher Education of the Russian Federation: 075-15-2021-677 We thank George Krasin from Lebedev Physical Institute for indispensable assistance in the graphical presentation of our scientific results. The equipment of the Ural Center for Shared Use “Modern nanotechnology” of Ural Federal University (Reg.#2968), which is supported by the Ministry of Science and Higher Education RF (Project #075-15-2021-677), was used. V.P.’s work was supported by Russian Science Foundation (project 21-72-00116). This research was funded by the Ministry of Science and Higher Education of the Russian Federation (Ural Federal University Program of Development within the Priority-2030 Program). |
Карточка проекта РНФ: | 21-72-00116 |
Располагается в коллекциях: | Научные публикации ученых УрФУ, проиндексированные в SCOPUS и WoS CC |
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2-s2.0-85163879301.pdf | 3,81 MB | Adobe PDF | Просмотреть/Открыть |
Лицензия на ресурс: Лицензия Creative Commons