Please use this identifier to cite or link to this item: http://elar.urfu.ru/handle/10995/117841
Title: Advanced Characterization of FeNi-Based Films for the Development of Magnetic Field Sensors with Tailored Functional Parameters
Authors: Komogortsev, S. V.
Vazhenina, I. G.
Kleshnina, S. A.
Iskhakov, R. S.
Lepalovskij, V. N.
Pasynkova, A. A.
Svalov, A. V.
Issue Date: 2022
Publisher: MDPI
Citation: Advanced Characterization of FeNi-Based Films for the Development of Magnetic Field Sensors with Tailored Functional Parameters / S. V. Komogortsev, I. G. Vazhenina, S. A. Kleshnina et al. // Sensors. — 2022. — Vol. 22. — Iss. 9. — 3324.
Abstract: Magnetometry and ferromagnetic resonance are used to quantitatively study magnetic anisotropy with an easy axis both in the film plane and perpendicular to it. In the study of single-layer and multilayer permalloy films, it is demonstrated that these methods make it possible not only to investigate the average field of perpendicular and in-plane anisotropy, but also to characterize their inhomogeneity. It is shown that the quantitative data from direct integral and local measurements of magnetic anisotropy are consistent with the direct and indirect estimates based on processing of the magnetization curves. The possibility of estimating the perpendicular magnetic anisotropy constant from the width of stripe domains in a film in the transcritical state is demonstrated. The average in-plane magnetic anisotropy field of permalloy films prepared by magnetron sputtering onto a Corning glass is almost unchanged with the thickness of a single-layer film. The inhomogeneity of the perpendicular anisotropy field for a 500 nm film is greater than that for a 100 nm film, and for a multilayer film with a total permalloy thickness of 500 nm, it is greater than that for a homogeneous film of the same thickness. © 2022 by the authors. Licensee MDPI, Basel, Switzerland.
Keywords: ANISOTROPY DISTRIBUTION
FERROMAGNETIC RESONANCE
HIGH FREQUENCY APPLICATIONS
MAGNETIC ANISOTROPY
MAGNETIC FIELD SENSORS
MAGNETOIMPEDANCE
MULTILAYERED STRUCTURES
THIN FILMS
FERROMAGNETIC MATERIALS
FERROMAGNETISM
FILM PREPARATION
IRON ALLOYS
MAGNETIC ANISOTROPY
MAGNETIC MULTILAYERS
MAGNETIC SENSORS
MAGNETOMETERS
MULTILAYER FILMS
NICKEL ALLOYS
ANISOTROPY DISTRIBUTION
FUNCTIONAL PARAMETERS
HIGH-FREQUENCY APPLICATIONS
INHOMOGENEITIES
MAGNETIC FIELDS SENSORS
MAGNETO-IMPEDANCE
MAGNETOIMPEDANCE
MULTI-LAYERED STRUCTURE
PERMALLOY FILMS
THIN-FILMS
FERROMAGNETIC RESONANCE
URI: http://elar.urfu.ru/handle/10995/117841
Access: info:eu-repo/semantics/openAccess
SCOPUS ID: 85128759792
WOS ID: 000794731000001
PURE ID: 30100618
ISSN: 14248220
DOI: 10.3390/s22093324
metadata.dc.description.sponsorship: Russian Science Foundation, RSF: 22-29-00980
Funding: This research was funded by the Russian Science Foundation (RSF), project no. 22-29-00980, https://rscf.ru/en/project/22-29-00980/ (accessed on 20 March 2022).
RSCF project card: 22-29-00980
Appears in Collections:Научные публикации ученых УрФУ, проиндексированные в SCOPUS и WoS CC

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