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Title: | Humidity effects on tip-induced polarization switching in lithium niobate |
Authors: | Ievlev, A. V. Morozovska, A. N. Shur, V. Ya. Kalinin, S. V. Шур, В. Я. |
Issue Date: | 2014 |
Publisher: | American Institute of Physics Inc. |
Citation: | Humidity effects on tip-induced polarization switching in lithium niobate / A. V. Ievlev, A. N. Morozovska, V. Ya. Shur, et al. — DOI 10.1063/1.4867979 // Applied Physics Letters. — 2014. — Vol. 104. — Iss. 9. — 092908. |
Abstract: | In the last several decades, ferroelectrics have attracted much attention as perspective materials for nonlinear optics and data storage devices. Scanning probe microscopy (SPM) has emerged as a powerful tool both for studies of domain structures with nanoscale spatial resolution and for writing the isolated nanodomains by local application of the electric field. Quantitative analysis of the observed behavior requires understanding the role of environmental factors on imaging and switching process. Here, we study the influence of the relative humidity in the SPM chamber on tip-induced polarization switching. The observed effects are attributed to existence of a water meniscus between the tip and the sample surface in humid atmosphere. These results are important for a deeper understanding of complex investigations of ferroelectric materials and their applications and suggest the necessity for fundamental studies of electrocapillary phenomena at the tip-surface junction and their interplay with bias-induced materials responses. © 2014 AIP Publishing LLC. |
Keywords: | ELECTRIC FIELDS FERROELECTRIC MATERIALS LITHIUM NIOBIUM COMPOUNDS NONLINEAR OPTICS OPTICAL SWITCHES POLARIZATION SCANNING PROBE MICROSCOPY SELF PHASE MODULATION VIRTUAL STORAGE DATA STORAGE DEVICES DOMAIN STRUCTURE ELECTROCAPILLARY ENVIRONMENTAL FACTORS FUNDAMENTAL STUDIES HUMID ATMOSPHERES NANOSCALE SPATIAL RESOLUTION SWITCHING PROCESS INDUCED POLARIZATION LOGGING |
URI: | http://elar.urfu.ru/handle/10995/102477 |
Access: | info:eu-repo/semantics/openAccess |
SCOPUS ID: | 84896751979 |
WOS ID: | 000332729200080 |
PURE ID: | 80005660-b7c9-4a4e-b6cf-62509e32b1dc 337210 |
ISSN: | 36951 |
DOI: | 10.1063/1.4867979 |
Appears in Collections: | Научные публикации ученых УрФУ, проиндексированные в SCOPUS и WoS CC |
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