Please use this identifier to cite or link to this item: http://elar.urfu.ru/handle/10995/102431
Title: The magnetic, electronic and optical properties of HoRhGe
Authors: Gupta, S.
Suresh, K. G.
Nigam, A. K.
Knyazev, Y. V.
Kuz'Min, Y. I.
Lukoyanov, A. V.
Issue Date: 2014
Publisher: Institute of Physics Publishing
Citation: The magnetic, electronic and optical properties of HoRhGe / S. Gupta, K. G. Suresh, A. K. Nigam, et al. — DOI 10.1088/0022-3727/47/36/365002 // Journal of Physics D: Applied Physics. — 2014. — Vol. 47. — Iss. 36. — 365002.
Abstract: The physical properties of polycrystalline HoRhGe have been studied experimentally and theoretically. The compound orders antiferromagnetically with a Néel temperature (TN) of 5.5K. It shows a large negative magnetoresistance (MR) of 25% at TN, for a field of 50kOe. However, at 2K and in lower fields, the MR is found to be positive with a magnitude of about 12%. The magnetocaloric effect has been estimated from both magnetization and heat capacity data and found to be large compared to many potential refrigerant materials in the same temperature range. The optical conductivity calculated theoretically from the ab initio results is in agreement with experimental values. The electronic structure calculations with the LSDA+U method accounting for the strong electronic correlations in the 4f shell of holmium show that the Ho 4f electronic states play a major role in determining its magnetic, electronic and optical properties. © 2014 IOP Publishing Ltd.
Keywords: ELECTRONIC STRUCTURES
MAGNETOCALORIC EFFECT
MAGNETORESISTANCE
OPTICAL PROPERTIES
CALCULATIONS
MAGNETOCALORIC EFFECTS
MAGNETORESISTANCE
OPTICAL CONDUCTIVITY
OPTICAL PROPERTIES
4F ELECTRONIC STATE
ELECTRONIC AND OPTICAL PROPERTIES
ELECTRONIC STRUCTURE CALCULATIONS
EXPERIMENTAL VALUES
HEAT-CAPACITY DATA
LARGE NEGATIVE MAGNETORESISTANCE
STRONG ELECTRONIC CORRELATIONS
TEMPERATURE RANGE
ELECTRONIC STRUCTURE
URI: http://elar.urfu.ru/handle/10995/102431
Access: info:eu-repo/semantics/openAccess
SCOPUS ID: 84906535777
WOS ID: 000341769900004
PURE ID: bc787b8f-142b-4182-b852-637c7c80618d
411972
ISSN: 223727
DOI: 10.1088/0022-3727/47/36/365002
Appears in Collections:Научные публикации ученых УрФУ, проиндексированные в SCOPUS и WoS CC

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