Please use this identifier to cite or link to this item: http://elar.urfu.ru/handle/10995/101938
Title: Atomic and electronic structure of graphene oxide/Cu interface
Authors: Boukhvalov, D. W.
Kurmaev, E. Z.
Urbańczyk, E.
Dercz, G.
Stolarczyk, A.
Simka, W.
Kukharenko, A. I.
Zhidkov, I. S.
Slesarev, A. I.
Zatsepin, A. F.
Cholakh, S. O.
Issue Date: 2018
Publisher: Elsevier B.V.
Citation: Atomic and electronic structure of graphene oxide/Cu interface / D. W. Boukhvalov, E. Z. Kurmaev, E. Urbańczyk, et al. — DOI 10.1016/j.tsf.2018.09.002 // Thin Solid Films. — 2018. — Vol. 665. — P. 99-108.
Abstract: The results of X-ray photoemission (XPS) and valence bands spectroscopy, optically stimulated electron emission (OSEE) measurements and density functional theory based modeling of graphene oxide (GO) placed on Cu via an electrophoretic deposition (EPD) are reported. The comparison of XPS spectra of EPD prepared GO/Cu composites with those of as prepared GO, strongly reduced GO, pure and oxidized copper demonstrate the partial (until C/O ratio about two) removal of oxygen-containing functional groups from GO simultaneously with the formation of copper oxide-like layers over the metallic substrate. OSEE measurements evidence the presence of copper oxide phase in the systems simultaneously with the absence of contributions from GO with corresponding energy gap. All measurements demonstrate the similarity of the results for different thickness of GO cover of the copper surface. Theoretical modeling demonstrates favorability of migration of oxygen-containing functional groups from GO to the copper substrate only for the case of C/O ratio below two and formation of Cu-O-C bonds between substrate and GO simultaneously with the vanishing of the energy gap in GO layer. Basing on results of experimental measurements and theoretical calculations we suggest the model of atomic structure for Cu/GO interface as Cu/CuO/GO with C/O ratio in gapless GO about two. © 2018 Elsevier B.V.
Keywords: CONDUCTIVITY
DENSITY FUNCTIONAL THEORY
GRAPHENE
GRAPHENE OXIDE
REDUCED GRAPHENE OXIDE
X-RAY PHOTOELECTRON SPECTROSCOPY
COPPER OXIDES
DENSITY FUNCTIONAL THEORY
DEPOSITION
ELECTRIC CONDUCTIVITY
ELECTRON EMISSION
ELECTRONIC STRUCTURE
ELECTROPHORESIS
ENERGY GAP
GRAPHENE OXIDE
OXYGEN
SUBSTRATES
X RAY PHOTOELECTRON SPECTROSCOPY
DIFFERENT THICKNESS
ELECTROPHORETIC DEPOSITIONS
FORMATION-OF-COPPER OXIDES
OXYGEN-CONTAINING FUNCTIONAL GROUPS
REDUCED GRAPHENE OXIDES
THEORETICAL CALCULATIONS
THEORETICAL MODELING
X-RAY PHOTOEMISSIONS
GRAPHENE
URI: http://elar.urfu.ru/handle/10995/101938
Access: info:eu-repo/semantics/openAccess
RSCI ID: 35730771
SCOPUS ID: 85053207088
WOS ID: 000447427400015
PURE ID: 6e99c1ac-d4e7-4ff7-add4-d8de667f3b5a
7890330
ISSN: 406090
DOI: 10.1016/j.tsf.2018.09.002
Appears in Collections:Научные публикации ученых УрФУ, проиндексированные в SCOPUS и WoS CC

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