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dc.contributor.authorGavrilov, N. V.en
dc.contributor.authorKamenetskikh, A. S.en
dc.contributor.authorTretnikov, P. V.en
dc.contributor.authorChukin, A. V.en
dc.date.accessioned2020-10-20T16:35:53Z-
dc.date.available2020-10-20T16:35:53Z-
dc.date.issued2019-
dc.identifier.citationGavrilov N. V. High-rate low-temperature PVD of thick 10 μm α-alumina coatings / N. V. Gavrilov, A. S. Kamenetskikh, P. V. Tretnikov, A. V. Chukin. — DOI 10.1088/1742-6596/1393/1/012082 // Journal of Physics: Conference Series. — 2019. — Vol. 1. — Iss. 1393. — 12082.en
dc.identifier.issn1742-6588-
dc.identifier.otherhttps://doi.org/10.1088/1742-6596/1393/1/012082pdf
dc.identifier.other1good_DOI
dc.identifier.othere4725403-6a2b-41f8-a8d6-9103243f5017pure_uuid
dc.identifier.otherhttp://www.scopus.com/inward/record.url?partnerID=8YFLogxK&scp=85077965962m
dc.identifier.urihttp://elar.urfu.ru/handle/10995/92467-
dc.description.abstractα-Al2O3 coatings have been deposited by evaporation of Al in an anodic arc with a growth rate of ∼ 5 μm•h-1 at 640?C under the conditions of low ionization of the Al vapors and an increased concentration of atomic oxygen, which has been achieved by the use of a hollow anode.Intensive (current density up to 15 mA•cm-2) low-energy (50 eV) ion bombardment has provided deposition of adhesive single-phase nanocrystalline (50-150 nm) α-Al2O3 coatings with a thickness of up to 10 μm with low intrinsic stresses (1.5 GPa) and low microstrains of the crystal lattice (less than 0.1%). The composition of the discharge plasma has been determined using the optical spectroscopy method. The effect of the O2 flow and the hollow anode current on the growth rate of the alumina coatings has been investigated and it has been shown that the increasing degree of O2 dissociation promotes an increase in the growth rate of coatings. © 2019 IOP Publishing Ltd. All rights reserved.en
dc.description.sponsorshipRussian Science Foundation, RSF: 18-19-00567en
dc.description.sponsorshipThis work was supported by the Russian Science Foundation (grant No. 18-19-00567).en
dc.format.mimetypeapplication/pdfen
dc.language.isoenen
dc.publisherInstitute of Physics Publishingen
dc.relationinfo:eu-repo/grantAgreement/RSF//18-19-00567en
dc.rightsinfo:eu-repo/semantics/openAccessen
dc.sourceJournal of Physics: Conference Seriesen
dc.subjectADHESIVESen
dc.subjectALUMINAen
dc.subjectALUMINUM COATINGSen
dc.subjectALUMINUM OXIDEen
dc.subjectELECTRIC DISCHARGESen
dc.subjectELECTRODESen
dc.subjectION BOMBARDMENTen
dc.subjectIONIZATION OF GASESen
dc.subjectNANOCRYSTALSen
dc.subjectPLASMA THEORYen
dc.subjectSPECTROSCOPIC ANALYSISen
dc.subjectTEMPERATUREen
dc.subjectALUMINA COATINGen
dc.subjectATOMIC OXYGENen
dc.subjectDISCHARGE PLASMAen
dc.subjectHOLLOW ANODESen
dc.subjectINTRINSIC STRESSen
dc.subjectLOW TEMPERATURESen
dc.subjectNANOCRYSTALLINESen
dc.subjectOPTICAL SPECTROSCOPYen
dc.subjectGROWTH RATEen
dc.titleHigh-rate low-temperature PVD of thick 10 μm α-alumina coatingsen
dc.typeConference Paperen
dc.typeinfo:eu-repo/semantics/conferenceObjecten
dc.typeinfo:eu-repo/semantics/publishedVersionen
dc.identifier.doi10.1088/1742-6596/1393/1/012082-
dc.identifier.scopus85077965962-
local.affiliationInstitute of Electrophysics UD RAS, 106 Amundsen Str., Yekaterinburg, 620016, Russian Federation
local.affiliationUral Federal University, 19 Mira Str., Yekaterinburg, 620002, Russian Federation
local.contributor.employeeGavrilov, N.V., Institute of Electrophysics UD RAS, 106 Amundsen Str., Yekaterinburg, 620016, Russian Federation
local.contributor.employeeKamenetskikh, A.S., Institute of Electrophysics UD RAS, 106 Amundsen Str., Yekaterinburg, 620016, Russian Federation, Ural Federal University, 19 Mira Str., Yekaterinburg, 620002, Russian Federation
local.contributor.employeeTretnikov, P.V., Institute of Electrophysics UD RAS, 106 Amundsen Str., Yekaterinburg, 620016, Russian Federation
local.contributor.employeeChukin, A.V., Ural Federal University, 19 Mira Str., Yekaterinburg, 620002, Russian Federation
local.issue1393-
local.volume1-
dc.identifier.wos000542026500081-
local.identifier.pure11898892-
local.description.order12082-
local.identifier.eid2-s2.0-85077965962-
local.fund.rsf18-19-00567-
local.identifier.wosWOS:000542026500081-
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