Kinetic test of a doped silicene-graphite anode element in a computer experiment

Galashev, A. Y.; Rakhmanova, O. R.; Zaikov, Y. P.

doi:10.1088/1742-6596/1435/1/012061

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Поле DC	Значение	Язык
dc.contributor.author	Galashev, A. Y.	en
dc.contributor.author	Rakhmanova, O. R.	en
dc.contributor.author	Zaikov, Y. P.	en
dc.date.accessioned	2020-10-20T16:35:51Z	-
dc.date.available	2020-10-20T16:35:51Z	-
dc.date.issued	2020	-
dc.identifier.citation	Galashev A. Y. Kinetic test of a doped silicene-graphite anode element in a computer experiment / A. Y. Galashev, O. R. Rakhmanova, Y. P. Zaikov. — DOI 10.1088/1742-6596/1435/1/012061 // Journal of Physics: Conference Series. — 2020. — Vol. 1. — Iss. 1435. — 12061.	en
dc.identifier.issn	17426588	-
dc.identifier.other	https://doi.org/10.1088/1742-6596/1435/1/012061	pdf
dc.identifier.other	1	good_DOI
dc.identifier.other	d13c1d65-bd6d-40f7-a526-558d5e93c72a	pure_uuid
dc.identifier.other	http://www.scopus.com/inward/record.url?partnerID=8YFLogxK&scp=85078983747	m
dc.identifier.uri	http://elar.urfu.ru/handle/10995/92456	-
dc.description.abstract	The stability of the system "bi-layer silicene on the graphite substrate" is studied in the molecular dynamics simulation. Silicene sheets are doped with phosphorus, and graphite sheets are doped with nitrogen. Lithium ion moves along a silicene channel with a gap in the range of 0.6-0.8 nm. The time for the ion to pass the channel and leave it decreases with an increase in the channel gap. There is a tendency of the silicene sheets roughness growth with an increase in the gap between silicene sheets (except, 0.75 nm). Doping phosphorus and nitrogen atoms stabilize the silicene and graphite structure. © 2020 Published under licence by IOP Publishing Ltd.	en
dc.description.sponsorship	Russian Science Foundation, RSF: 16-13-00061	en
dc.description.sponsorship	The study is supported by the Russian Science Foundation (project no. 16-13-00061).	en
dc.format.mimetype	application/pdf	en
dc.language.iso	en	en
dc.publisher	Institute of Physics Publishing	en
dc.relation	info:eu-repo/grantAgreement/RSF//16-13-00061	en
dc.rights	info:eu-repo/semantics/openAccess	en
dc.source	Journal of Physics: Conference Series	en
dc.subject	GRAPHITE	en
dc.subject	HIGH ENERGY PHYSICS	en
dc.subject	MOLECULAR DYNAMICS	en
dc.subject	NITROGEN	en
dc.subject	PHOSPHORUS	en
dc.subject	SYSTEM STABILITY	en
dc.subject	COMPUTER EXPERIMENT	en
dc.subject	GRAPHITE ANODE	en
dc.subject	GRAPHITE SHEETS	en
dc.subject	GRAPHITE STRUCTURES	en
dc.subject	GRAPHITE SUBSTRATE	en
dc.subject	KINETIC TESTS	en
dc.subject	MOLECULAR DYNAMICS SIMULATIONS	en
dc.subject	NITROGEN ATOM	en
dc.subject	SILICENE	en
dc.title	Kinetic test of a doped silicene-graphite anode element in a computer experiment	en
dc.type	Conference Paper	en
dc.type	info:eu-repo/semantics/conferenceObject	en
dc.type	info:eu-repo/semantics/publishedVersion	en
dc.identifier.doi	10.1088/1742-6596/1435/1/012061	-
dc.identifier.scopus	85078983747	-
local.affiliation	Institute of High-Temperature Electrochemistry, UBRAS, Akademicheskaya Str. 20, Yekaterinburg, 620990, Russian Federation
local.affiliation	Ural Federal University, Mira Str. 19, Yekaterinburg, 620002, Russian Federation
local.contributor.employee	Galashev, A.Y., Institute of High-Temperature Electrochemistry, UBRAS, Akademicheskaya Str. 20, Yekaterinburg, 620990, Russian Federation, Ural Federal University, Mira Str. 19, Yekaterinburg, 620002, Russian Federation
local.contributor.employee	Rakhmanova, O.R., Institute of High-Temperature Electrochemistry, UBRAS, Akademicheskaya Str. 20, Yekaterinburg, 620990, Russian Federation, Ural Federal University, Mira Str. 19, Yekaterinburg, 620002, Russian Federation
local.contributor.employee	Zaikov, Y.P., Institute of High-Temperature Electrochemistry, UBRAS, Akademicheskaya Str. 20, Yekaterinburg, 620990, Russian Federation, Ural Federal University, Mira Str. 19, Yekaterinburg, 620002, Russian Federation
local.issue	1435	-
local.volume	1	-
dc.identifier.wos	000617199500060	-
local.identifier.pure	12233566	-
local.description.order	12061	-
local.identifier.eid	2-s2.0-85078983747	-
local.fund.rsf	16-13-00061	-
local.identifier.wos	WOS:000617199500060	-
Располагается в коллекциях:	Научные публикации ученых УрФУ, проиндексированные в SCOPUS и WoS CC

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